Per citar aquest document: http://ddd.uab.cat/record/116269
Post-radiation-induced soft breakdown conduction properties as a function of temperature
Cester, Andrea (Universitá di Padova. Dipartimento di Elettronica e Informatica)
Suñé, Jordi, 1963- (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica)
American Physical Society

Data: 2001
Resum: When a thin oxide is subjected to heavy ion irradiation, a large leakage current similar to the soft breakdown can be produced. In this work, we have studied the radiation soft breakdown (RSB) after 257 MeV Ag and I irradiation by using a quantum point contact (QPC) model, which also applies to hard and soft breakdown produced by electrical stresses. We have also studied the temperature dependence of RSB current from 98 K up to room temperature, and found that the gate current after irradiation is strongly reduced by decreasing temperature. It is shown that this behavior can be attributed to a temperature dependence of the carriers supplied from the cathode rather than to a temperature-induced modification of the size and/or shape of the oxide RSB paths.
Drets: Tots els drets reservats.
Llengua: Anglès
Document: article ; recerca ; publishedVersion
Matèria: Electric currents ; Electrical breakdown ; Cathodes ; Electrical properties ; Ion radiation effects ; Ionic conduction ; Leakage currents ; Point contacts
Publicat a: Applied Physics Letters, Vol. 79, Issue 9 (July 2001) , p. 1336-1338, ISSN 1077-3118

DOI: 10.1063/1.1398329


4 p, 300.2 KB

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