Per citar aquest document: http://ddd.uab.cat/record/116306
180 diffusion through amorphous SiOs and cristobalite
Rodríguez Viejo, Javier (Institut des Sciences et de Génie des Matériaux et Procédés (Font-Romeu, França))
Sibieude, F. (Institut des Sciences et de Génie des Matériaux et Procédés (Font-Romeu, França))
Clavaguera-Mora, M. T. (Universitat Autònoma de Barcelona. Departament de Física)
Monty, C. (Laboratoire de Physique des Matériaux (Meudon, França))
American Physical Society

Data: 1993
Resum: Secondary ion mass spectrometry was used to profile the diffusion of oxygen in polycrystalline β‐cristobalite and vitreous SiO2. The tracer concentration profiles of cristobalite are consistent with a model based on two mechanisms: bulk and short‐circuit diffusion. The profiles of partially crystallized samples containing vitreous SiO2 and β‐cristobalite were fitted using the sum of two complementary error functions and taking account of some interstitial‐network exchange. The bulk oxygen diffusivity, in the temperature range 1240–1500 °C, is about five times greater for vitreous silica than for β‐cristobalite.
Drets: Tots els drets reservats.
Llengua: Anglès
Document: article ; recerca ; publishedVersion
Matèria: Diffusion ; Mass diffusion ; Polycrystals ; Secondary ion mass spectroscopy ; Silica
Publicat a: Applied Physics Letters, Vol. 63, Issue 14 (October 1993) , p. 1906-1908, ISSN 1077-3118

DOI: 10.1063/1.110644


4 p, 664.3 KB

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