Index of artpub/2001/116266/

Porti i Pujal, Marc
Nanometer-scale electrical characterization of stressed ultrathin SiO2 films using conducting atomic force microscopy
2001
https://ddd.uab.cat/record/116266
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[ ]1=Porti_i_Pujal,_Marc2022-06-29 13:23 20  
[ ]2=Nanometer-scale_electrical_characterization...2022-06-29 13:23 119  
[ ]3=20012022-06-29 13:23 5  
[ ]4=1162662022-06-29 13:23 34  
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