Index of artpub/2002/116259/

Porti i Pujal, Marc
Breakdown-induced negative charge in ultrathin SiO2 films measured by atomic force microscopy
2002
https://ddd.uab.cat/record/116259
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[ ]1=Porti_i_Pujal,_Marc2022-06-29 13:24 20  
[ ]2=Breakdown-induced_negative_charge_in_ultrathin...2022-06-29 13:24 95  
[ ]3=20022022-06-29 13:24 5  
[ ]4=1162592022-06-29 13:24 34  
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