Index of artpub/2011/117259/

Iglesias Santiso, Vanessa
Degradation of polycrystalline HfO2-based gate dielectrics under nanoscale electrical stress
2011
https://ddd.uab.cat/record/117259
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[ ]2=Degradation_of_polycrystalline_HfO2-based...2022-06-29 13:26 93  
[ ]3=20112022-06-29 13:26 5  
[ ]4=1172592022-06-29 13:26 34  
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