Index of artpub/2013/136864/

Crespo-Yepes, Albert
Resistive switching like-behavior in MOSFETs with ultra-thin HfSiON dielectric gate stack : pMOS and nMOS comparison and reliability implications
2013
https://ddd.uab.cat/record/136864
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[ ]1=Crespo-Yepes,_Albert2022-06-29 13:27 21  
[ ]2=Resistive_switching_like-behavior_in_MOSFETs...2022-06-29 13:27 146  
[ ]3=20132022-06-29 13:27 5  
[ ]4=1368642022-06-29 13:27 34  
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