Index of artpub/2015/133466/

Maestro Izquierdo, Marcos
Analysis of set and reset mechanisms in Ni/HfO2-based RRAM with fast ramped voltages
2015
https://ddd.uab.cat/record/133466
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[ ]3=20152022-06-29 13:29 5  
[ ]4=1334662022-06-29 13:29 34  
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