Index of artpub/2015/163086/

Wu, Qian
Channel-Hot-Carrier degradation of strained MOSFETs : A device level and nanoscale combined approach
2015
https://ddd.uab.cat/record/163086
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[ ]3=20152022-06-29 13:29 5  
[ ]4=1630862022-06-29 13:29 34  
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