This is the accepted version of the article:

Mavredakis N., Wei W., Pallecchi E., Vignaud D., Happy H.,
Cortadella R.G., Schaefer N., Calia A.B., Garrido J.A., Jimenez
D.. Low-frequency noise parameter extraction method for
single-layer graphene FETs. IEEE Transactions on Electron
Devices, (2020). 67. 9042866: 2093 - .
10.1109/TED.2020.2978215.

Available at: https://dx.doi.org/10.1109/TED.2020.2978215