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Devices;2022;69;9;10.1109/TED.2022.3188945Multilevel 3-D Device Simulation Approach Applied to Deeply Scaled Nanowire Field Effect TransistorsDrift-diffusion (DD)Monte Carlo (MC)nanowire (NW)semiconductor device simulationtight-binding (TB)Natalia SeoaneKarol KalnaXavier CartoixaAntonio Garcia-Loureiro IEEE Transactions on Electron Devices5276 Sept. 2022910.1109/TED.2022.3188945695282 VoR Pages: Page: Label: 1 Annotations: Annotation: Subtype: Link Rect: 124, 633, 132, 643 Flags: Print Annotation: Subtype: Link Rect: 474, 633, 482, 643 Flags: Print Annotation: Subtype: Link Rect: 272, 633, 280, 643 Flags: Print Annotation: Subtype: Link Rect: 332, 620, 340, 630 Flags: Print Thumb: true Page: Label: 2 Thumb: true Page: Label: 3 Thumb: true Page: Label: 4 Thumb: true Page: Label: 5 Thumb: true Page: Label: 6 Annotations: Annotation: Subtype: Link Rect: 67, 42, 136, 50 Flags: Print Annotation: Subtype: Link Rect: 330, 678, 420, 686 Flags: Print Annotation: Subtype: Link Rect: 330, 642, 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