Index of tesis/2013/hdl_10803_107847/

Crespo-Yepes, Albert
Estudio de la reversibilidad de la ruptura dieléctrica en dispositivos MOS con dieléctrico de puerta high-k ultra delgado
2013
https://ddd.uab.cat/record/114029
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[ ]1=Crespo-Yepes,_Albert2022-11-08 17:28 21  
[ ]2=Estudio_de_la_reversibilidad_de_la_ruptura...2022-11-08 17:28 124  
[ ]3=20132022-11-08 17:28 5  
[ ]4=1140292022-11-08 17:28 34  
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