Index of tesis/2013/hdl_10803_126515/

Bayerl, Albin
Variability and reliability at the nanoscale of gate dielectrics of MOS devices and graphene based structures
2013
https://ddd.uab.cat/record/117058
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[ ]1=Bayerl,_Albin2022-11-08 17:28 14  
[ ]2=Variability_and_reliability_at_the_nanoscale...2022-11-08 17:28 110  
[ ]3=20132022-11-08 17:28 5  
[ ]4=1170582022-11-08 17:28 34  
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