Index of tesis/2016/hdl_10803_400200/

Velayudhan, Vikas
TCAD study of interface traps-related variability in ultra-scaled MOSFETs
2016
https://ddd.uab.cat/record/175865
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[ ]3=20162022-11-08 17:29 5  
[ ]4=1758652022-11-08 17:29 34  
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