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1.
4 p, 300.2 KB Post-radiation-induced soft breakdown conduction properties as a function of temperature / Cester, Andrea (Universitá di Padova. Dipartimento di Elettronica e Informatica) ; Suñé, Jordi, 1963- (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Paccagnella, Alessandro (Universitá di Padova. Dipartimento di Elettronica e Informatica) ; Miranda, Enrique Alberto (Universidad de Buenos Aires. Departamento de Fı́sica) ; American Physical Society
When a thin oxide is subjected to heavy ion irradiation, a large leakage current similar to the soft breakdown can be produced. In this work, we have studied the radiation soft breakdown (RSB) after 257 MeV Ag and I irradiation by using a quantum point contact (QPC) model, which also applies to hard and soft breakdown produced by electrical stresses. [...]
2001 - 10.1063/1.1398329
Applied Physics Letters, Vol. 79, Issue 9 (July 2001) , p. 1336-1338  
2.
4 p, 474.9 KB Approach to study the noise properties in nanoscale electronic devices / Oriols Pladevall, Xavier (Universitat Autònoma de Barcelona. Departament d’Enginyeria Electrònica) ; Suñé, Jordi, 1963- (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Martín, Ferran, (Martín Antolín) (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; American Physical Society
An approach to study the noisecharacteristics in mesoscopic devices is presented. It extends, via quantum trajectories, the classical particle Monte Carlo techniques to devices where quantum nonlocal effects are important. [...]
2001 - 10.1063/1.1402651
Applied Physics Letters, Vol. 79, Issue 11 (July 2001) , p. 1703-1705  

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