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1.
4 p, 235.0 KB Isothermal tuning of exchange bias using pulsed fields / Nogués, Josep (Institut Català de Nanociència i Nanotecnologia) ; Sort Viñas, Jordi (Universitat Autònoma de Barcelona. Departament de Física) ; Suriñach, Santiago (Suriñach Cornet) (Universitat Autònoma de Barcelona. Departament de Física) ; Muñoz Domínguez, Juan Santiago (Universitat Autònoma de Barcelona. Departament de Física) ; Baró, M. D. (Universitat Autònoma de Barcelona. Departament de Física) ; Bobo, Jean-François (Institut national des sciences appliquées de Toulouse) ; Lüders, Ulrike Anne (Institut national des sciences appliquées de Toulouse) ; Haanappel, E. (Laboratoire National des Champs Magnétiques Pulsés) ; Fitzsimmons, M. R. (Los Alamos National Laboratory) ; Hoffmann, Axel (Argonne National Laboratory. Materials Science Division) ; Cai, J. W. (Chinese Academy of Sciences. Institute of Physics)
Exchange bias,HE, and coercivity,HC, of antiferromagnetic (AFM)/ferromagnetic bilayers can be adjusted, after deposition, at temperatures below the Néel temperature of the AFM by subjecting the samples to large pulsed fields (in excess of HPulse=550 kOe). [...]
2003 - 10.1063/1.1565711
Applied physics letters, Vol. 82, Issue 18 (April 2003) , p. 3044-3046  
2.
4 p, 227.5 KB Measuring electrical current during scanning probe oxidation / Pérez Murano, Francesc (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Martín Olmos, Cristina (Institut de Microelectrònica de Barcelona) ; Barniol i Beumala, Núria (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Kuramochi, H. (Nanotechnology Research Institute (Ibaraki, Japó)) ; Yokoyama, H. (Nanotechnology Research Institute (Ibaraki, Japó)) ; Dagata, J. A. (National Institute of Standards and Technology (Gaithersburg, Estats Units d'Amèrica)) ; American Physical Society
Electrical current is measured during scanning probe oxidation by performing force versus distance curves under the application of a positive sample voltage. It is shown how the time dependence of the current provides information about the kinetics of oxide growth under conditions in which the tip-surface distance is known unequivocally during current acquisition. [...]
2003 - 10.1063/1.1572480
Applied physics letters, Vol. 82, Issue 18 (April 2003) , p. 3086-3088  

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