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1.
4 p, 235.0 KB Isothermal tuning of exchange bias using pulsed fields / Nogués i Sanmiquel, Josep (Institut Català de Nanociència i Nanotecnologia) ; Sort Viñas, Jordi (Universitat Autònoma de Barcelona. Departament de Física) ; Suriñach, Santiago (Suriñach Cornet) (Universitat Autònoma de Barcelona. Departament de Física) ; Muñoz Domínguez, Juan Santiago (Universitat Autònoma de Barcelona. Departament de Física) ; Baró, M. D. (Universitat Autònoma de Barcelona. Departament de Física) ; Bobo, Jean-François (Institut national des sciences appliquées de Toulouse) ; Lüders, Ulrike Anne (Institut national des sciences appliquées de Toulouse) ; Haanappel, E. (Laboratoire National des Champs Magnétiques Pulsés) ; Fitzsimmons, M. R. (Los Alamos National Laboratory) ; Hoffmann, Axel (Argonne National Laboratory. Materials Science Division) ; Cai, J. W. (Chinese Academy of Sciences. Institute of Physics)
Exchange bias,HE, and coercivity,HC, of antiferromagnetic (AFM)/ferromagnetic bilayers can be adjusted, after deposition, at temperatures below the Néel temperature of the AFM by subjecting the samples to large pulsed fields (in excess of HPulse=550 kOe). [...]
2003 - 10.1063/1.1565711
Applied Physics Letters, Vol. 82, Issue 18 (April 2003) , p. 3044-3046  
2.
4 p, 227.5 KB Measuring electrical current during scanning probe oxidation / Pérez Murano, Francesc (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Martín Olmos, Cristina (Institut de Microelectrònica de Barcelona (IMB-CNM)) ; Barniol i Beumala, Núria (Universitat Autònoma de Barcelona. Departament de Enginyeria Electrònica) ; Kuramochi, H. (Nanotechnology Research Institute (Ibaraki, Japó)) ; Yokoyama, H. (Nanotechnology Research Institute (Ibaraki, Japó)) ; Dagata, J. A. (National Institute of Standards and Technology (Gaithersburg, Estats Units d'Amèrica)) ; American Physical Society
Electrical current is measured during scanning probe oxidation by performing force versus distance curves under the application of a positive sample voltage. It is shown how the time dependence of the current provides information about the kinetics of oxide growth under conditions in which the tip–surface distance is known unequivocally during current acquisition. [...]
2003 - 10.1063/1.1572480
Applied Physics Letters, Vol. 82, Issue 18 (April 2003) , p. 3086-3088  

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