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16 p, 9.9 MB Imaging water thin films in ambient conditions using Atomic Force Microscopy / Santos, Serge (Masdar Institute of Science and Technology. Laboratory for Energy and NanoScience) ; Verdaguer Prats, Albert (Institut Català de Nanociència i Nanotecnologia)
All surfaces exposed to ambient conditions are covered by a thin film of water. Other than at high humidity conditions, i. e. , relative humidity higher than 80%, those water films have nanoscale thickness. [...]
2016 - 10.3390/ma9030182
Materials, Vol. 9, issue 3 (March 2016) , art.p. E182  

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