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Articles, 2 registres trobats
Articles 2 registres trobats  
4 p, 611.3 KB Current-induced cleaning of graphene / Moser, Joel (Centre d'Investigació en Nanociència i Nanotecnologia (CIN2)) ; Barreiro Megino, Amelia (Centre d'Investigació en Nanociència i Nanotecnologia (CIN2)) ; Bachtold, Adrian (Centre d'Investigació en Nanociència i Nanotecnologia (CIN2)) ; American Physical Society
A simple yet highly reproducible method to suppress contamination of graphene at low temperature inside the cryostat is presented. The method consists of applying a current of several milliamperes through the graphene device, which is here typically a few microns wide. [...]
2007 - 10.1063/1.2789673
Applied Physics Letters, Vol. 91, Issue 16 (October 2007) , p. 163513/1-163513/3  
4 p, 554.7 KB The environment of graphene probed by electrostatic force microscopy / Moser, Joel (Institut Català de Nanotecnologia) ; Verdaguer, A. (Institut Català de Nanotecnologia) ; Jiménez Jiménez, David (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Barreiro Megino, Amelia (Institut Català de Nanotecnologia) ; Bachtold, Adrian (Institut Català de Nanotecnologia) ; American Physical Society
We employ electrostatic force microscopy to study the electrostatic environment of graphene sheets prepared with the micromechanical exfoliation technique. We detect the electric dipole of residues left from the adhesive tape during graphene preparation, as well as the dipole of water molecules adsorbed on top of graphene. [...]
2008 - 10.1063/1.2898501
Applied Physics Letters, Vol. 92, Issue 12 (March 2008) , p. 123507/1-123507/3  

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