Resultados globales: 3 registros encontrados en 0.02 segundos.
Artículos, Encontrados 3 registros
Artículos Encontrados 3 registros  
1.
7 p, 5.0 MB Straightforward bias- and frequency-dependent small-signal model extraction for single-layer graphene FETs / Mavredakis, Nikolaos (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Pacheco-Sánchez, Aníbal (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Wei, Wei (Université de Lille) ; Pallecchi, Emiliano (Université de Lille) ; Happy, Henri (Université de Lille) ; Jiménez Jiménez, David (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica)
We propose an explicit small-signal graphene field-effect transistor (GFET) parameter extraction procedure based on a charge-based quasi-static model. The dependence of the small-signal parameters on both gate voltage and frequency is precisely validated by high-frequency (up to 18 GHz) on-wafer measurements from a 300 nm device. [...]
2023 - 10.1016/j.mejo.2023.105715
Microelectronics Journal, Vol. 133 (March 2023) , art. 105715  
2.
8 p, 2.6 MB Low-frequency noise parameter extraction method for single-layer graphene FETs / Mavredakis, Nikolaos (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Wei, Wei (Université de Lille. Institute of Electronics, Microelectronics and Nanotechnology) ; Pallecchi, Emiliano (Université de Lille. Institute of Electronics, Microelectronics and Nanotechnology) ; Vignaud, Dominique (Université de Lille. Institute of Electronics, Microelectronics and Nanotechnology) ; Happy, Henri (Université de Lille. Institute of Electronics, Microelectronics and Nanotechnology) ; Garcia Cortadella, Ramon (Institut Català de Nanociència i Nanotecnologia) ; Schaefer, Nathan (Institut Català de Nanociència i Nanotecnologia) ; Bonaccini Calia, Andrea (Institut Català de Nanociència i Nanotecnologia) ; Garrido, Jose (Institut Català de Nanociència i Nanotecnologia) ; Jiménez Jiménez, David (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica)
In this article, a detailed parameter extraction methodology is proposed for low-frequency noise (LFN) in single-layer (SL) graphene transistors (GFETs) based on a recently established compact LFN model. [...]
2020 - 10.1109/TED.2020.2978215
IEEE transactions on electron devices, Vol. 67, issue 5 (May 2020) , p. 2093-2099  
3.
21 p, 2.8 MB Velocity Saturation Effect on Low Frequency Noise in Short Channel Single Layer Graphene Field Effect Transistors / Mavredakis, Nikolaos (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Wei, Wei (Institute of Electronics, Microelectronics and Nanotechnology) ; Pallecchi, Emiliano (Institute of Electronics, Microelectronics and Nanotechnology) ; Vignaud, Dominique (Institute of Electronics, Microelectronics and Nanotechnology) ; Happy, Henri (Institute of Electronics, Microelectronics and Nanotechnology) ; Garcia Cortadella, Ramon (Institut Català de Nanociència i Nanotecnologia) ; Bonaccini Calia, Andrea (Institut Català de Nanociència i Nanotecnologia) ; Garrido, Jose (Institut Català de Nanociència i Nanotecnologia) ; Jiménez Jiménez, David (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica)
Graphene devices for analog and radio frequency (RF) applications are prone to low frequency noise (LFN) due to its up conversion to undesired phase noise at higher frequencies. Such applications demand the use of short channel graphene transistors (GFETs) that operate at high electric fields in order to ensure a high speed. [...]
2019 - 10.1021/acsaelm.9b00604
ACS applied electronic materials, Vol. 1, Issue 12 (December 2019) , p. 2626-2636  

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