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7 p, 884.6 KB Reduction of the thermal conductivity in free-standing silicon nano-membranes investigated by non-invasive Raman thermometry / Chávez Ángel, Emigdio (Institut Català de Nanociència i Nanotecnologia) ; Reparaz, Juan Sebastian (Institut Català de Nanociència i Nanotecnologia) ; Gomis-Bresco, Jordi (Institut Català de Nanociència i Nanotecnologia) ; Wagner, Markus R.. (Institut Català de Nanociència i Nanotecnologia) ; Cuffe, John (Massachusetts Institute of Technology) ; Graczykowski, Bartlomiej (Institut Català de Nanociència i Nanotecnologia) ; Shchepetov, Andrey (VTT Technical Research Centre of Finland) ; Jiang, Hua (Aalto University School of Science) ; Prunnila, Mika (VTT Technical Research Centre of Finland) ; Ahopelto, Jouni (VTT Technical Research Centre of Finland) ; Alzina, Francesc (Institut Català de Nanociència i Nanotecnologia) ; Sotomayor Torres, Clivia M. (Institut Català de Nanociència i Nanotecnologia)
We report on the reduction of the thermal conductivity in ultra-thin suspended Si membranes with high crystalline quality. A series of membranes with thicknesses ranging from 9 nm to 1. 5 μm was investigated using Raman thermometry, a novel contactless technique for thermal conductivity determination. [...]
2014 - 10.1063/1.4861796
APL materials, Vol. 2, Issue 1 (January 2014) , art. 12113  

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