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4 p, 227.5 KB Measuring electrical current during scanning probe oxidation / Pérez Murano, Francesc (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Martín Olmos, Cristina (Institut de Microelectrònica de Barcelona (IMB-CNM)) ; Barniol i Beumala, Núria (Universitat Autònoma de Barcelona. Departament de Enginyeria Electrònica) ; Kuramochi, H. (Nanotechnology Research Institute (Ibaraki, Japó)) ; Yokoyama, H. (Nanotechnology Research Institute (Ibaraki, Japó)) ; Dagata, J. A. (National Institute of Standards and Technology (Gaithersburg, Estats Units d'Amèrica)) ; American Physical Society
Electrical current is measured during scanning probe oxidation by performing force versus distance curves under the application of a positive sample voltage. It is shown how the time dependence of the current provides information about the kinetics of oxide growth under conditions in which the tip–surface distance is known unequivocally during current acquisition. [...]
2003 - 10.1063/1.1572480
Applied Physics Letters, Vol. 82, Issue 18 (April 2003) , p. 3086-3088  

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