Resultados globales: 2 registros encontrados en 0.01 segundos.
Artículos, Encontrados 2 registros
Artículos Encontrados 2 registros  
1.
4 p, 327.5 KB Theoretical evidence for the kick-out mechanism for B diffusion in SiC / Rurali, Riccardo (Centro Nacional de Microelectrónica) ; Godignon, Philippe (Centro Nacional de Microelectrónica) ; Rebollo Palacios, José Andrés (Centro Nacional de Microelectrónica) ; Ordejon, Pablo (Institut de Ciència de Materials de Barcelona) ; Hernández, Eduardo R. (Institut de Ciència de Materials de Barcelona) ; American Physical Society
In this letter, we analyze by means of first-principles electronic structure calculations the diffusion of B impurities in 3C-SiC. We find, through molecular dynamics, that substitutional B at a Si lattice site is readily displaced by a nearby Si interstitial by the process known as a kick-out mechanism, in agreement with recent experimental results. [...]
2002 - 10.1063/1.1515369
Applied physics letters, Vol. 81, Issue 16 (October 2002) , p. 2989-2991  
2.
4 p, 272.4 KB First-principles study of n-type dopants and their clustering in SiC / Rurali, Riccardo (Centro Nacional de Microelectrónica) ; Godignon, Philippe (Centro Nacional de Microelectrónica) ; Rebollo Palacios, José Andrés (Centro Nacional de Microelectrónica) ; Hernández, Eduardo R. (Institut de Ciència de Materials de Barcelona) ; Ordejon, Pablo (Institut de Ciència de Materials de Barcelona) ; American Physical Society
We report the results of an ab initio study of N and P dopants in SiC. We find that while N substitutes most favorably at a C lattice site, P does so preferably at a Si site, except in n-doping and Si-rich 3C-SiC. [...]
2003 - 10.1063/1.1583870
Applied physics letters, Vol. 82, Issue 24 (June 2003) , p. 4298-4300  

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