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9 p, 2.6 MB Analysis and simulation of the multiple resistive switching modes occurring in HfO x -based resistive random access memories using memdiodes / Petzold, S. (Technische Universität Darmstadt. Institute of Materials Science) ; Miranda, Enrique (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Sharath, S. U. (Technische Universität Darmstadt. Institute of Materials Science) ; Muñoz Gorriz, Jordi (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Vogel, Tobias (Technische Universität Darmstadt. Institute of Materials Science) ; Piros, E. (Technische Universität Darmstadt. Institute of Materials Science.) ; Kaiser, Nico (Technische Universität Darmstadt. Institute of Materials Science) ; Eilhardt, R. (Technische Universität Darmstadt. Institute of Materials Science) ; Zintler, A. (Technische Universität Darmstadt. Institute of Materials Science) ; Molina-Luna, L. (Technische Universität Darmstadt. Institute of Materials Science) ; Suñé, Jordi 1963- (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Alff, Lambert (Technische Universität Darmstadt. Institute of Materials Science)
In this work, analysis and simulation of all experimentally observed switching modes in hafnium oxide based resistive random access memories are carried out using a simplified electrical conduction model. [...]
2019 - 10.1063/1.5094864
Journal of applied physics, Vol. 125, issue 23 (June 2019) , art. 234503  

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