Resultats globals: 30 registres trobats en 0.02 segons.
Articles, 30 registres trobats
Articles 30 registres trobats  1 - 10següentfinal  anar al registre:
1.
6 p, 937.0 KB Converse flexoelectricity yields large piezoresponse force microscopy signals in non-piezoelectric materials / Abdollahi, Amir (Universitat Politècnica de Catalunya) ; Domingo Marimon, Neus (Institut Català de Nanociència i Nanotecnologia) ; Arias, Irene (Universitat Politècnica de Catalunya) ; Catalan, Gustau (Institut Català de Nanociència i Nanotecnologia)
Converse flexoelectricity is a mechanical stress induced by an electric polarization gradient. It can appear in any material, irrespective of symmetry, whenever there is an inhomogeneous electric field distribution. [...]
2019 - 10.1038/s41467-019-09266-y
Nature communications, Vol. 10 (March 2019) , art. 1266  
2.
16 p, 9.9 MB Imaging water thin films in ambient conditions using Atomic Force Microscopy / Santos, Serge (Masdar Institute of Science and Technology. Laboratory for Energy and NanoScience) ; Verdaguer Prats, Albert (Institut Català de Nanociència i Nanotecnologia)
All surfaces exposed to ambient conditions are covered by a thin film of water. Other than at high humidity conditions, i. e. , relative humidity higher than 80%, those water films have nanoscale thickness. [...]
2016 - 10.3390/ma9030182
Materials, Vol. 9, issue 3 (March 2016) , art.p. E182  
3.
8 p, 2.0 MB Determination of the length of single-walled carbon nanotubes by scanning electron microscopy / Sandoval, Stefania (Institut de Ciència de Materials de Barcelona) ; Kierkowicz, Magdalena (Institut de Ciència de Materials de Barcelona) ; Pach, Elzbieta (Institut Català de Nanociència i Nanotecnologia) ; Ballesteros, Belén (Institut Català de Nanociència i Nanotecnologia) ; Tobias, Gerard (Institut de Ciencia de Materials de Barcelona)
A methodology is presented to determine the length of well individualized single-walled carbon nanotubes (SWCNTs) by means of scanning electron microscopy (SEM). Accurate measurements on wide areas of the sample can be achieved in an easy, fast and trustworthy manner. [...]
2018 - 10.1016/j.mex.2018.11.004
MethodsX, Vol. 5 (2018) , p. 1465-1472  
4.
12 p, 1.2 MB Identification of HIV-1-Based Virus-like Particles by Multifrequency Atomic Force Microscopy / González-Domínguez, Irene (Universitat Autònoma de Barcelona. Departament d'Enginyeria Química, Biològica i Ambiental) ; Gutiérrez Granados, Sonia (Universitat Autònoma de Barcelona. Departament d'Enginyeria Química, Biològica i Ambiental) ; Cervera García, Laura (Universitat Autònoma de Barcelona. Departament d'Enginyeria Química, Biològica i Ambiental) ; Gòdia i Casablancas, Francesc (Universitat Autònoma de Barcelona. Departament d'Enginyeria Química Biològica i Ambiental) ; Domingo Marimon, Neus (Institut Català de Nanociència i Nanotecnologia)
Virus-like particles (VLPs) have become a promising platform for vaccine production. VLPs are formed by structural viral proteins that inherently self-assemble when expressed in a host cell. They represent a highly immunogenic and safe vaccine platform, due to the absence of the viral genome and its high protein density. [...]
2016 - 10.1016/j.bpj.2016.07.046
Biophysical Journal, Vol. 111, Núm. 6 (September 2016) , p. 1173-1179  
5.
25 p, 6.7 MB AFM Imaging of Mercaptobenzoic Acid on Au(110) : Submolecular Contrast with Metal Tips / Hauptmann, Nadine (Radboud University. Institute for Molecules and Materials.) ; Robles, Roberto (Institut Català de Nanociència i Nanotecnologia) ; Abufager, Paula (Universidad Nacional de Rosario. Instituto de Física de Rosario) ; Lorente, Nicolás (Centro de Física de Materiales (San Sebastián. España)) ; Berndt, Richard (Christian-Albrechts-Universität zu Kiel. Institut für Experimentelle und Angewandte Physik)
A self-assembled monolayer of mercaptobenzoic acid (MBA) on Au(110) is investigated with scanning tunneling and atomic force microscopy (STM and AFM) and density functional calculations. High-resolution AFM images obtained with metallic tips show clear contrasts between oxygen atoms and phenyl moieties. [...]
2016 - 10.1021/acs.jpclett.6b00684
Journal of physical chemistry letters, Vol. 7, Issue 11 (June 2016) , p. 1984-1990  
6.
9 p, 1.3 MB Functional dependence of resonant harmonics on nanomechanical parameters in dynamic mode atomic force microscopy / Gramazio, Federico (Institut Català de Nanociència i Nanotecnologia) ; Lorenzoni, Matteo (Institut de Microelectrònica de Barcelona) ; Pérez-Murano, Francesc (Institut de Microelectrònica de Barcelona) ; Rull Trinidad, Enrique (Technische Universiteit Delft) ; Staufer, Urs (Technische Universiteit Delft) ; Fraxedas i Calduch, Jordi (Institut Català de Nanociència i Nanotecnologia)
We present a combined theoretical and experimental study of the dependence of resonant higher harmonics of rectangular cantilevers of an atomic force microscope (AFM) as a function of relevant parameters such as the cantilever force constant, tip radius and free oscillation amplitude as well as the stiffness of the sample's surface. [...]
2017 - 10.3762/bjnano.8.90
Beilstein journal of nanotechnology, Vol. 8 (April 2017) , p. 883-891  
7.
10 p, 2.3 MB Unlocking higher harmonics in atomic force microscopy with gentle interactions / Santos, Sergio (Universitat Politècnica de Catalunya. Departament de Disseny i Programació de Sistemes Electrònics) ; Barcons, Victor (Universitat Politècnica de Catalunya. Departament de Disseny i Programació de Sistemes Electrònics) ; Font, Josep (Universitat Politècnica de Catalunya. Departament de Disseny i Programació de Sistemes Electrònics) ; Verdaguer Prats, Albert (Institut Català de Nanociència i Nanotecnologia)
In dynamic atomic force microscopy, nanoscale properties are encoded in the higher harmonics. Nevertheless, when gentle interactions and minimal invasiveness are required, these harmonics are typically undetectable. [...]
2014 - 10.3762/bjnano.5.29
Beilstein journal of nanotechnology, Vol. 5 (2014) , p. 268-277  
8.
19 p, 606.3 KB Dually actuated atomic force microscope with miniaturized magnetic bead-actuators for single-molecule force measurements / Sevim, Semih (Bogazici University. Department of Electrical and Electronics Engineering) ; Ozer, Sevil (Bogazici University. Department of Electrical and Electronics Engineering) ; Feng, Luying (Bogazici University. Department of Electrical and Electronics Engineering) ; Wurzel, Joel (University of Würzburg. Institute of Pharmacy and Food Chemistry) ; Fakhraee, Arielle (Aeon Scientific AG) ; Shamsudhin, Naveen (ETH Zurich. Institute of Robotics and Intelligent Systems) ; Jang, Bumjin (ETH Zurich. Institute of Robotics and Intelligent Systems) ; Alcantara, Carlos (ETH Zurich. Institute of Robotics and Intelligent Systems) ; Ergeneman, Olgaç (ETH Zurich. Institute of Robotics and Intelligent Systems) ; Pellicer Vilà, Eva M. (Eva Maria) (Universitat Autònoma de Barcelona. Departament de Física) ; Sort Viñas, Jordi (Institució Catalana de Recerca i Estudis Avançats) ; Lühmann, Tessa (University of Würzburg. Institute of Pharmacy and Food Chemistry) ; Pané i Vidal, Salvador (ETH Zurich. Institute of Robotics and Intelligent Systems) ; Nelson, Bradley J. (ETH Zurich. Institute of Robotics and Intelligent Systems) ; Torun, Hamdi (Bogazici University. Department of Electrical and Electronics Engineering)
We report for the first time on a novel Atomic Force Microscopy (AFM) technique with dual actuation capabilities using both piezo and magnetic bead actuation for advanced single-molecule force spectroscopy experiments. [...]
2016 - 10.1039/c6nh00134c
Nanoscale, Vol. 1, Issue 6 (November 2016) , p. 488-495  
9.
17 p, 2.7 MB Conductive-AFM topography and current maps simulator for the study of polycrystalline high-k dielectrics / Couso, C. (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Porti i Pujal, Marc (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Martín Martínez, Javier (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Iglesias, V. (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Nafría i Maqueda, Montserrat (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Aymerich Humet, Xavier (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica)
In this work, a simulator of conductive atomic force microscopy (C-AFM) was developed to reproduce topography and current maps. In order to test the results, the authors used the simulator to investigate the influence of the C-AFM tip on topography measurements of polycrystalline high-k dielectrics, and compared the results with experimental data. [...]
2015 - 10.1116/1.4915328
Journal of Vaccuum Science and Technology B, Vol. 33 No. 3 (May-June 2015) , p031801/1-031801/6  
10.
14 p, 5.7 MB Scanning probe microscopies for analytical studies at the nanometer scale / Esplandiu Egido, Maria José (Universitat Autònoma de Barcelona. Grup de Recerca de Sensors i Biosensors)
The scanning probe microscopies (SPM) have transformed the way of studying the structure and the properties of a wide variety of systems. Without doubt, they have exerted a pivotal role in many scientific disciplines like physics, chemistry, biology and engineering and have helped to give birth to novel fields such as the nanoscience and nanotechnology. [...]
Les microscòpies locals de rastreig han transformat la manera d'estudiar l'estructura i les propietats d'una gran varietat de sistemes. Sens dubte, han tingut un paper essencial en moltes disciplines, com ara la física, la química, la biologia i l'enginyeria, i han contribuït al naixement de nous camps, com ara la nanociència i la nanotecnologia. [...]

2005
Contributions to science, Vol. 3, Núm. 1 (2005) , p. 33-46  

Articles : 30 registres trobats   1 - 10següentfinal  anar al registre:
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