Resultats globals: 26 registres trobats en 0.05 segons.
Articles, 26 registres trobats
Articles 26 registres trobats  1 - 10següentfinal  anar al registre:
1.
25 p, 6.7 MB AFM Imaging of Mercaptobenzoic Acid on Au(110) : Submolecular Contrast with Metal Tips / Hauptmann, Nadine (Radboud University. Institute for Molecules and Materials.) ; Robles Rodríguez, Roberto (Institut Català de Nanociència i Nanotecnologia) ; Abufager, Paula (Universidad Nacional de Rosario. Instituto de Física de Rosario) ; Lorente, Nicolás (Centro de Física de Materiales (San Sebastián. España)) ; Berndt, Richard (Christian-Albrechts-Universität zu Kiel. Institut für Experimentelle und Angewandte Physik)
A self-assembled monolayer of mercaptobenzoic acid (MBA) on Au(110) is investigated with scanning tunneling and atomic force microscopy (STM and AFM) and density functional calculations. High-resolution AFM images obtained with metallic tips show clear contrasts between oxygen atoms and phenyl moieties. [...]
2016 - 10.1021/acs.jpclett.6b00684
Journal of Physical Chemistry Letters, Vol. 7, Issue 11 (June 2016) , p. 1984-1990  
2.
9 p, 1.3 MB Functional dependence of resonant harmonics on nanomechanical parameters in dynamic mode atomic force microscopy / Gramazio, Federico (Institut Català de Nanociència i Nanotecnologia) ; Lorenzoni, Matteo (Institut de Microelectrònica de Barcelona) ; Pérez-Murano, Francesc (Institut de Microelectrònica de Barcelona) ; Rull Trinidad, Enrique (Technische Universiteit Delft) ; Staufer, Urs (Technische Universiteit Delft) ; Fraxedas i Calduch, Jordi (Institut Català de Nanociència i Nanotecnologia)
We present a combined theoretical and experimental study of the dependence of resonant higher harmonics of rectangular cantilevers of an atomic force microscope (AFM) as a function of relevant parameters such as the cantilever force constant, tip radius and free oscillation amplitude as well as the stiffness of the sample's surface. [...]
2017 - 10.3762/bjnano.8.90
Beilstein Journal of Nanotechnology, Vol. 8 (April 2017) , p. 883-891  
3.
10 p, 2.3 MB Unlocking higher harmonics in atomic force microscopy with gentle interactions / Santos, Sergio (Universitat Politècnica de Catalunya. Departament de Disseny i Programació de Sistemes Electrònics) ; Barcons, Victor (Universitat Politècnica de Catalunya. Departament de Disseny i Programació de Sistemes Electrònics) ; Font, Josep (Universitat Politècnica de Catalunya. Departament de Disseny i Programació de Sistemes Electrònics) ; Verdaguer Prats, Albert (Institut Català de Nanociència i Nanotecnologia)
In dynamic atomic force microscopy, nanoscale properties are encoded in the higher harmonics. Nevertheless, when gentle interactions and minimal invasiveness are required, these harmonics are typically undetectable. [...]
2014 - 10.3762/bjnano.5.29
Beilstein Journal of Nanotechnology, Vol. 5 (2014) , p. 268-277  
4.
19 p, 606.3 KB Dually actuated atomic force microscope with miniaturized magnetic bead-actuators for single-molecule force measurements / Sevim, Semih (Bogazici University. Department of Electrical and Electronics Engineering) ; Ozer, Sevil (Bogazici University. Department of Electrical and Electronics Engineering) ; Feng, Luying (Bogazici University. Department of Electrical and Electronics Engineering) ; Wurzel, Joel (University of Würzburg. Institute of Pharmacy and Food Chemistry) ; Fakhraee, Arielle (Aeon Scientific AG) ; Shamsudhin, Naveen (ETH Zurich. Institute of Robotics and Intelligent Systems) ; Jang, Bumjin (ETH Zurich. Institute of Robotics and Intelligent Systems) ; Alcantara, Carlos (ETH Zurich. Institute of Robotics and Intelligent Systems) ; Ergeneman, Olgaç (ETH Zurich. Institute of Robotics and Intelligent Systems) ; Pellicer Vilà, Eva M. (Eva Maria) (Universitat Autònoma de Barcelona. Departament de Física) ; Sort Viñas, Jordi (Institució Catalana de Recerca i Estudis Avançats) ; Lühmann, Tessa (University of Würzburg. Institute of Pharmacy and Food Chemistry) ; Pané, Salvador (ETH Zurich. Institute of Robotics and Intelligent Systems) ; Nelson, Bradley J. (ETH Zurich. Institute of Robotics and Intelligent Systems) ; Torun, Hamdi (Bogazici University. Department of Electrical and Electronics Engineering)
We report for the first time on a novel Atomic Force Microscopy (AFM) technique with dual actuation capabilities using both piezo and magnetic bead actuation for advanced single-molecule force spectroscopy experiments. [...]
2016 - 10.1039/c6nh00134c
Nanoscale Horizons, Vol. 1, Issue 6 (November 2016) , p. 488-495  
5.
17 p, 2.7 MB Conductive-AFM topography and current maps simulator for the study of polycrystalline high-k dielectrics / Couso, C. (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Porti i Pujal, Marc (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Martín Martínez, Javier (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Iglesias, V. (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Nafría i Maqueda, Montserrat (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Aymerich Humet, Xavier (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica)
In this work, a simulator of conductive atomic force microscopy (C-AFM) was developed to reproduce topography and current maps. In order to test the results, the authors used the simulator to investigate the influence of the C-AFM tip on topography measurements of polycrystalline high-k dielectrics, and compared the results with experimental data. [...]
2015 - 10.1116/1.4915328
Journal of Vaccuum Science and Technology B, Vol. 33 No. 3 (May-June 2015) , p031801/1-031801/6  
6.
14 p, 5.7 MB Scanning probe microscopies for analytical studies at the nanometer scale / Esplandiu Egido, Maria José (Universitat Autònoma de Barcelona. Grup de Recerca de Sensors i Biosensors)
The scanning probe microscopies (SPM) have transformed the way of studying the structure and the properties of a wide variety of systems. Without doubt, they have exerted a pivotal role in many scientific disciplines like physics, chemistry, biology and engineering and have helped to give birth to novel fields such as the nanoscience and nanotechnology. [...]
Les microscòpies locals de rastreig han transformat la manera d'estudiar l'estructura i les propietats d'una gran varietat de sistemes. Sens dubte, han tingut un paper essencial en moltes disciplines, com ara la física, la química, la biologia i l'enginyeria, i han contribuït al naixement de nous camps, com ara la nanociència i la nanotecnologia. [...]

2005
Contributions to science, Vol. 3, Núm. 1 (2005) , p. 33-46  
7.
5 p, 1.9 MB Gate current analysis of AlGaN/GaN on silicon heterojunction transistors at the nanoscale / Fontsere Recuenco, Abel (Centro Nacional de Microelectrónica) ; Pérez Tomàs, Amador (Centro Nacional de Microelectrónica) ; Placidi, Marcel (Centro Nacional de Microelectrónica) ; Aguiló Llobet, Jordi (Universitat Autònoma de Barcelona. Departament de Microelectrònica i Sistemes Electrònics) ; Baron, N. (Centre national de la recherche scientifique (França)) ; Chenot, S. (Centre national de la recherche scientifique (França)) ; Cordier, Y. (Centre national de la recherche scientifique (França)) ; Moreno, J. C. (Centre national de la recherche scientifique (França)) ; Iglesias Santiso, Vanessa (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Porti i Pujal, Marc (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Bayerl, Albin (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Lanza Martínez, Mario (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Nafría i Maqueda, Montserrat (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica)
The gate leakage current of AlGaN/GaN (on silicon)high electron mobility transistor(HEMT) is investigated at the micro and nanoscale. The gate current dependence (25–310 °C) on the temperature is used to identify the potential conduction mechanisms, as trap assisted tunneling or field emission. [...]
2012 - 10.1063/1.4748115
Applied Physics Letters, Vol. 101, Issue 9 (August 2012) , p. 093505/1-093505/4  
8.
4 p, 325.4 KB Using exchange bias to extend the temperature range of square loop behavior in [Pt/Co] multilayers with perpendicular anisotropy / Sort Viñas, Jordi (Universitat Autònoma de Barcelona. Departament de Física) ; Suriñach, Santiago (Suriñach Cornet) (Universitat Autònoma de Barcelona. Departament de Física) ; Garcia, F. (SPINTEC (Spin Electronics Research)) ; Auffret, S. (SPINTEC (Spin Electronics Research)) ; Rodmacq, B. (SPINTEC (Spin Electronics Research)) ; Dieny, B. (SPINTEC (Spin Electronics Research)) ; Langlais, Veronique (Universitat Autònoma de Barcelona. Department de Física) ; Muñoz Domínguez, Juan Santiago (Universitat Autònoma de Barcelona. Department de Física) ; Baró, M. D. (Universitat Autònoma de Barcelona. Department de Física) ; Nogués i Sanmiquel, Josep (Universitat Autònoma de Barcelona. Departament de Física)
The temperature dependence of the magnetic properties of [Pt/Co]multilayers (ML), exhibiting perpendicular anisotropy, with and without exchange biasing with an antiferromagnet(AFM) has been investigated. [...]
2005 - 10.1063/1.2139840
Applied Physics Letters, Vol. 87, Issue 24 (December 2005) , p. 242504/1-242504/3  
9.
4 p, 503.7 KB Surface behavior of La2/3Ca1/3MnO3 epitaxial thin films / Abad Muñoz, Llibertat (Institut de Ciència de Materials de Barcelona) ; Martínez Perea, Benjamín (Institut de Ciència de Materials de Barcelona) ; Balcells Argemí, Lluís (Institut de Ciència de Materials de Barcelona) ; American Physical Society
The role of the surface layers in La2/3Ca1/3MnO3 magnetic oxide epitaxialthin films is analyzed. We show that the topmost layers do play a very relevant role on the transport properties acting as an insulating barrier. [...]
2005 - 10.1063/1.2133925
Applied Physics Letters, Vol. 87, Issue 21 (November 2005) , p. 212502  
10.
4 p, 346.4 KB Large exchange bias and its connection to interface structure in FeF2–Fe bilayers / Nogués i Sanmiquel, Josep (University of California, San Diego. Department of Physics) ; Lederman, D. (University of California, San Diego. Department of Physics) ; Morán, T. J. (University of California, San Diego. Department of Physics) ; Schuller, Ivan K. (University of California, San Diego. Department of Physics) ; Rao, K. V. (Kungl. Tekniska högskolan. Department of Condensed Matter Physics) ; American Physical Society
Large exchange bias effects (ΔE 1. 1 erg/cm2) were observed in antiferromagnetic (FeF2)–ferromagnetic (Fe) bilayers grown on MgO. The FeF2 grows along the spin‐compensated (110) direction. The FeF2–Fe interface roughness was characterized using specular and diffuse x‐ray diffraction and atomic force microscopy. [...]
1996 - 10.1063/1.115819
Applied Physics Letters, Vol. 68, Issue 22 (May 1996) , p. 3186-3188  

Articles : 26 registres trobats   1 - 10següentfinal  anar al registre:
Us interessa rebre alertes sobre nous resultats d'aquesta cerca?
Definiu una alerta personal via correu electrònic o subscribiu-vos al canal RSS.