Results overview: Found 2 records in 0.02 seconds.
Articles, 2 records found
Articles 2 records found  
1.
6 p, 1.4 MB On the promotion of catalytic reactions by surface acoustic waves / von Boehn, Bernhard (Leibniz Universität Hannover. Institut für Physikalische Chemie und Elektrochemie) ; Foerster, Michael (ALBA Laboratori de Llum de Sincrotró) ; von Boehn, Moritz (Leibniz Universität Hannover. Institut für Physikalische Chemie und Elektrochemie) ; Prat, Jordi (ALBA Laboratori de Llum de Sincrotró) ; Macià, Ferran (Universitat de Barcelona. Departament de Física de la Matèria Condensada) ; Casals, Blai (Institut de Ciència de Materials de Barcelona) ; Khaliq, Muhammad Waqas (ALBA Laboratori de Llum de Sincrotró) ; Hernández-Mínguez, Alberto (Paul Drude Institut für Festkörperelektronik) ; Aballe, Lucía (ALBA Laboratori de Llum de Sincrotró) ; Imbihl, Ronald (Leibniz Universität Hannover. Institut für Physikalische Chemie und Elektrochemie)
Surface acoustic waves (SAW) allow to manipulate surfaces with potential applications in catalysis, sensor and nanotechnology. SAWs were shown to cause a strong increase in catalytic activity and selectivity in many oxidation and decomposition reactions on metallic and oxidic catalysts. [...]
2020 - 10.1002/anie.202005883
Angewandte Chemie (International ed. Internet), Vol. 59, issue 45 (Nov. 2020) , p. 20224-20229  
2.
8 p, 1.6 MB The ALBA spectroscopic LEEM-PEEM experimental station : Layout and performance / Aballe, Lucía (ALBA Laboratori de Llum de Sincrotró) ; Foerster, Michael (ALBA Laboratori de Llum de Sincrotró) ; Pellegrin, Eric (ALBA Laboratori de Llum de Sincrotró) ; Nicolás, Josep (ALBA Laboratori de Llum de Sincrotró) ; Ferrer Fàbregas, Salvador (ALBA Laboratori de Llum de Sincrotró)
The spectroscopic LEEM-PEEM experimental station at the CIRCE helical undulator beamline, which started user operation at the ALBA Synchrotron Light Facility in 2012, is presented. This station, based on an Elmitec LEEM III microscope with electron imaging energy analyzer, permits surfaces to be imaged with chemical, structural and magnetic sensitivity down to a lateral spatial resolution better than 20nm with X-ray excited photoelectrons and 10nm in LEEM and UV-PEEM modes. [...]
2015 - 10.1107/S1600577515003537
Journal of Synchrotron Radiation, Vol. 22, Part 3 (May 2015) , p. 745-752  

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