Surface oxidation - Resultados de la búsqueda - Depósito Digital de Documentos de la UAB

Buscar colecciones:

Ordenar por:	Mostrar resultados:	Formato de visualización:

Resultados globales: 5 registros encontrados en 0.02 segundos.
Artículos, Encontrados 5 registros

Artículos	Encontrados 5 registros

9 p, 3.3 MB

Oxidation processes at the surface of BaTiO3 thin films under environmental conditions / Spasojevic, Irena (Universitat Autònoma de Barcelona. Departament de Química) ; Sauthier, Guillaume (Institut Català de Nanociència i Nanotecnologia) ; Caicedo Roque, Jose Manuel (Institut Català de Nanociència i Nanotecnologia) ; Verdaguer Prats, Albert (Institut de Ciència de Materials de Barcelona) ; Domingo Marimon, Neus (Institut Català de Nanociència i Nanotecnologia)
Dissociation and adsorption of water on ferroelectric oxide surfaces play important role in the processes of screening and switching dynamics of ferroelectric polarization, as well as in catalytic processes which can be additionally coupled with light, temperature or vibration stimuli. [...]
2021 - DOI (Digital Object Identifier)

10.1016/j.apsusc.2021.150288
Applied surface science, Vol. 565 (Nov. 2021) , art. 150288

Registro completo -

5 p, 526.4 KB

Synthesis of polydopamine at the femtoliter scale and confined fabrication of Ag nanoparticles on surfaces / Guardingo Melián, Mireia (Institut Català de Nanociència i Nanotecnologia) ; Esplandiu Egido, Maria José (Institut Català de Nanociència i Nanotecnologia) ; Ruiz-Molina, Daniel (Institut Català de Nanociència i Nanotecnologia)
Nanoscale polydopamine motives are fabricated on surfaces by deposition of precursor femtolitre droplets with an AFM tip and used as confined reactors to fabricate Ag nanoparticles patterns by in-situ reduction of an Ag+ salt.
2014 - DOI (Digital Object Identifier)

10.1039/c4cc02500h
Chemical communications, Vol. 50 issue 83 (2014) , p. 12548-12551

Registro completo -

$Chemical strain and oxidation-reduction kinetics of epitaxial thin films of mixed ionic-electronic conducting oxides determined by x-ray diffraction$

6 p, 510.6 KB

Chemical strain and oxidation-reduction kinetics of epitaxial thin films of mixed ionic-electronic conducting oxides determined by x-ray diffraction / Moreno, Roberto (Institut Català de Nanociència i Nanotecnologia) ; Zapata Correa, James Arturo (Institut Català de Nanociència i Nanotecnologia) ; Roqueta, Jaume (Institut Català de Nanociència i Nanotecnologia) ; Bagués Salgueró, Núria (Institut Català de Nanociència i Nanotecnologia) ; Santiso, José (Institut Català de Nanociència i Nanotecnologia)
X-ray diffraction, at high T's and switching between N/air atmospheres, was used to compare the chemical expansion due oxygen non-stoichiometry variations between epitaxial films of different mixed ionic-electronic conductors: LaSrCoO(LSC), BaSrCoFeO(BSCF), LaNiO(LNO), LaNiO(L2NO) and GaBaCoO(GBCO) and LaSrMnO(LSM). [...]
2014 - DOI (Digital Object Identifier)

10.1149/2.0091411jes
Journal of the Electrochemical Society, Vol. 161, Issue 11 (2014) , p. F3046-F3051

Registro completo -

4 p, 630.0 KB

Modification of HF-treated silicon (100) surfaces by scanning tunneling microscopy in air under imaging conditions / Barniol i Beumala, Núria (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Pérez Murano, Francesc (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Aymerich Humet, Xavier (Universitat Autònoma de Barcelona. Departament de Física) ; American Physical Society
The modification of HF-etched silicon (100) surface with a scanning tunneling microscope(STM) operated in air is studied for the first time in samples subjected to the standard HF etching without the follow-up rinsing in H2O. [...]
1992 - DOI (Digital Object Identifier)

10.1063/1.107885
Applied physics letters, Vol. 61, Issue 4 (July 1992) , p. 462-464

Registro completo -

4 p, 414.9 KB

Local oxidation of silicon surfaces by dynamic force microscopy : nanofabrication and water bridge formation / García, Ricardo (Instituto de Microelectrónica de Madrid) ; Calleja, M. (Instituto de Microelectrónica de Madrid) ; Pérez Murano, Francesc (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; American Physical Society
Local oxidation of siliconsurfaces by atomic force microscopy is a very promising lithographic approach at nanometer scale. Here, we study the reproducibility, voltage dependence, and kinetics when the oxidation is performed by dynamic force microscopy modes. [...]
1998 - DOI (Digital Object Identifier)

10.1063/1.121340
Applied physics letters, Vol. 72, Issue 18 (May 1998) , p. 2295-2297

Registro completo -

¿Le interesa recibir alertas sobre nuevos resultados de esta búsqueda?
Defina una alerta personal vía correo electrónico o subscríbase al canal RSS.