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$Chemical strain and oxidation-reduction kinetics of epitaxial thin films of mixed ionic-electronic conducting oxides determined by x-ray diffraction$

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Chemical strain and oxidation-reduction kinetics of epitaxial thin films of mixed ionic-electronic conducting oxides determined by x-ray diffraction / Moreno, Roberto (Institut Català de Nanociència i Nanotecnologia) ; Zapata Correa, James Arturo (Institut Català de Nanociència i Nanotecnologia) ; Roqueta, Jaume (Institut Català de Nanociència i Nanotecnologia) ; Bagués Salgueró, Núria (Institut Català de Nanociència i Nanotecnologia) ; Santiso, José (Institut Català de Nanociència i Nanotecnologia)
X-ray diffraction, at high T's and switching between N/air atmospheres, was used to compare the chemical expansion due oxygen non-stoichiometry variations between epitaxial films of different mixed ionic-electronic conductors: LaSrCoO(LSC), BaSrCoFeO(BSCF), LaNiO(LNO), LaNiO(L2NO) and GaBaCoO(GBCO) and LaSrMnO(LSM). [...]
2014 - DOI (Digital Object Identifier)

10.1149/2.0091411jes
Journal of the Electrochemical Society, Vol. 161, Issue 11 (2014) , p. F3046-F3051

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