Depósito Digital de Documentos de la UAB Encontrados 5 registros  La búsqueda tardó 0.02 segundos. 
1.
10 p, 6.7 MB Identifying the nature of surface chemical modification for directed self-assembly of block copolymers / Evangelio Araujo, Laura (Institut Català de Nanociència i Nanotecnologia) ; Gramazio, Federico (Institut Català de Nanociència i Nanotecnologia) ; Lorenzoni, Matteo (Institut de Microelectrònica de Barcelona) ; Gorgoi, Michaela (Helmholtz-Zentrum Berlin. Energy Materials In-situ Laboratory) ; Espinosa, Francisco Miguel (Instituto de Ciencia de Materiales de Madrid) ; García, Ricardo (Instituto de Ciencia de Materiales de Madrid) ; Pérez-Murano, Francesc (Institut de Microelectrònica de Barcelona) ; Fraxedas i Calduch, Jordi (Institut Català de Nanociència i Nanotecnologia)
In recent years, block copolymer lithography has emerged as a viable alternative technology for advanced lithography. In chemical-epitaxy-directed self-assembly, the interfacial energy between the substrate and each block copolymer domain plays a key role on the final ordering. [...]
2017 - 10.3762/bjnano.8.198
Beilstein journal of nanotechnology, Vol. 8 (Sep. 2017) , p. 1972-1981  
2.
9 p, 1.3 MB Functional dependence of resonant harmonics on nanomechanical parameters in dynamic mode atomic force microscopy / Gramazio, Federico (Institut Català de Nanociència i Nanotecnologia) ; Lorenzoni, Matteo (Institut de Microelectrònica de Barcelona) ; Pérez-Murano, Francesc (Institut de Microelectrònica de Barcelona) ; Rull Trinidad, Enrique (Technische Universiteit Delft) ; Staufer, Urs (Technische Universiteit Delft) ; Fraxedas i Calduch, Jordi (Institut Català de Nanociència i Nanotecnologia)
We present a combined theoretical and experimental study of the dependence of resonant higher harmonics of rectangular cantilevers of an atomic force microscope (AFM) as a function of relevant parameters such as the cantilever force constant, tip radius and free oscillation amplitude as well as the stiffness of the sample's surface. [...]
2017 - 10.3762/bjnano.8.90
Beilstein Journal of Nanotechnology, Vol. 8 (April 2017) , p. 883-891  
3.
12 p, 3.4 MB A single-source precursor route to anisotropic halogen-doped zinc oxide particles as a promising candidate for new transparent conducting oxide materials / Lehr, Daniela (University of Konstanz (German). Department of Chemistry) ; Wagner, Markus R (Institut Català de Nanociència i Nanotecnologia) ; Flock, Johanna (University of Konstanz (German). Department of Physics) ; Reparaz, Juan Sebastián (Institut Català de Nanociència i Nanotecnologia) ; Sotomayor Torres, Clivia M. (Institut Català de Nanociència i Nanotecnologia) ; Klaiber, Alexander (University of Konstanz (German). Department of Chemistry) ; Dekorsy, Thomas (University of Konstanz (German). Department of Physics) ; Polarz, Sebastian (University of Konstanz (German). Department of Chemistry)
Numerous applications in optoelectronics require electrically conducting materials with high optical transparency over the entire visible light range. A solid solution of indium oxide and substantial amounts of tin oxide for electronic doping (ITO) is currently the most prominent example for the class of so-called TCOs (transparent conducting oxides). [...]
2015 - 10.3762/bjnano.6.222
Beilstein Journal of Nanotechnology, Vol. 6 (2015) , p. 2161-2172  
4.
11 p, 1.8 MB Capillary and van der Waals interactions on CaF crystals from amplitude modulation AFM force reconstruction profiles under ambient conditions / Calò, Annalisa (Institut Català de Nanociència i Nanotecnologia) ; Vidal Robles, Oriol (Institut Català de Nanociència i Nanotecnologia) ; Santos, Sergio (Universitat Politècnica de Catalunya. Departament de Disseny i Programació de Sistemes Electrònics) ; Verdaguer Prats, Albert (Institut Català de Nanociència i Nanotecnologia)
There has been much interest in the past two decades to produce experimental force profiles characteristic of the interaction between nanoscale objects or a nanoscale object and a plane. Arguably, the advent of the atomic force microscope AFM was instrumental in driving such efforts because, in principle, force profiles could be recovered directly. [...]
2015 - 10.3762/bjnano.6.84
Beilstein journal of nanotechnology, Vol. 6 (2015) , p. 809-819  
5.
10 p, 2.3 MB Unlocking higher harmonics in atomic force microscopy with gentle interactions / Santos, Sergio (Universitat Politècnica de Catalunya. Departament de Disseny i Programació de Sistemes Electrònics) ; Barcons, Victor (Universitat Politècnica de Catalunya. Departament de Disseny i Programació de Sistemes Electrònics) ; Font, Josep (Universitat Politècnica de Catalunya. Departament de Disseny i Programació de Sistemes Electrònics) ; Verdaguer Prats, Albert (Institut Català de Nanociència i Nanotecnologia)
In dynamic atomic force microscopy, nanoscale properties are encoded in the higher harmonics. Nevertheless, when gentle interactions and minimal invasiveness are required, these harmonics are typically undetectable. [...]
2014 - 10.3762/bjnano.5.29
Beilstein Journal of Nanotechnology, Vol. 5 (2014) , p. 268-277  

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