Depósito Digital de Documentos de la UAB Encontrados 13 registros  1 - 10siguiente  ir al registro: La búsqueda tardó 0.00 segundos. 
1.
4 p, 549.7 KB A barrier to spin filters / Valenzuela, Sergio O. (Institut Català de Nanociència i Nanotecnologia) ; Roche, Stephan (Institut Català de Nanociència i Nanotecnologia)
Electron tunnelling through a two-dimensional magnetic insulator is assisted by magnon inelastic processes that provide spin-filtering.
2018 - 10.1038/s41928-018-0089-x
Nature electronics, Vol. 1, Núm. 6 (June 2018) , p. 328-329  
2.
7 p, 1.0 MB Impact of contact overlap on transconductance and noise in organic electrochemical transistors / Polyravas, Anastasios G. (University of Cambridge. Department of Engineering) ; Curto, Vincenzo F. (University of Cambridge. Department of Engineering) ; Schaefer, Nathan (Institut Català de Nanociència i Nanotecnologia) ; Bonaccini Calia, Andrea (Institut Català de Nanociència i Nanotecnologia) ; Guimerà Brunet, Anton (Institut de Microelectrònica de Barcelona) ; Garrido Ariza, José A. (Institut Català de Nanociència i Nanotecnologia) ; Malliaras, George G. (University of Cambridge. Department of Engineering)
Organic electrochemical transistors (OECTs) from poly(3,4-ethylenedioxythiophene) doped with polystyrene sulfonate (PEDOT:PSS) are used as amplifying transducers for bioelectronics. Although the impact on performance of device geometry parameters such as channel area and thickness has been widely explored, the overlap between the semiconductor film and the source and drain contacts has not been considered. [...]
2019 - 10.1088/2058-8585/ab4dc4
Flexible and printed electronics, Vol. 4, Núm. 4 (December 2019) , art. 44003  
3.
MyROOT 2.0 : An automatic tool for high throughput and accurate primary root length measurement / González, Alejandro (Universitat Ramon Llull. La Salle. Grup de recerca en Tecnologies Media) ; Sevillano, Xavier (Universitat Ramon Llull. La Salle. Grup de recerca en Tecnologies Media) ; Betegón Putze, Isabel (Centre de Recerca en Agrigenòmica) ; Blasco Escámez, David (Centre de Recerca en Agrigenòmica) ; Ferrer, Marc (Universitat Ramon Llull. La Salle. Grup de recerca en Tecnologies Media) ; Caño Delgado, Ana I. (Centre de Recerca en Agrigenòmica)
The automatic measurement of external physical traits (i. e. phenotyping) of plant organs, such as root length -which is highly correlated with plant viability- is one of the current bottlenecks in academic and agricultural research. [...]
2020 - 10.1016/j.compag.2019.105125
Computers and Electronics in Agriculture, Vol. 168 (January 2020) , art. 105125  
4.
NanoElectronics roadmap for Europe : from nanodevices and innovative materials to system integration / Ahopelto, Jouni (VTT Technical Research Centre of Finland) ; Ardila, Gustavo (Université Grenoble Alpes) ; Baldi, L. ; Balestra, Francis (Université Grenoble Alpes) ; Belot, Didier (CEA-Leti) ; Fagas, Gíorgos (Tyndall National Institute) ; De Gendt, Stephan (IMEC) ; Demarchi, Danilo (Politecnico di Torino) ; Fernández Bolaños, Montserrat (Swiss Federal Institute of Technology) ; Holden, David (CEA-Leti) ; Ionescu, Adrian Mihai (EPFL) ; Meneghesso, Gaudenzio (University of Padova) ; Mocuta, Anda C. (IMEC) ; Pfeffer, Markus (Fraunhofer IISB) ; Popp, Ralf M. (edacentrum GmbH) ; Sangiorgi, Enrico C. (University of Bologna) ; Sotomayor Torres, Clivia M. (Institut Català de Nanociència i Nanotecnologia)
The NEREID project ("NanoElectronics Roadmap for Europe: Identification and Dissemination") is dedicated to mapping the future of European Nanoelectronics. NEREID's objective is to develop a medium and long term roadmap for the European nanoelectronics industry, starting from the needs of applications to address societal challenges and leveraging the strengths of the European eco-system. [...]
2019 - 10.1016/j.sse.2019.03.014
Solid-state electronics, Vol. 155 (May 2019) , p. 7-19  
5.
42 p, 2.1 MB Applications in security and evasions in machine learning : a survey / Sagar, Ramani (Gujarat Technological University) ; Jhaveri, Rutvij (Pandit Deendayal Petroleum University) ; Borrego Iglesias, Carlos (Universitat Autònoma de Barcelona. Departament d'Enginyeria de la Informació i de les Comunicacions)
In recent years, machine learning (ML) has become an important part to yield security and privacy in various applications. ML is used to address serious issues such as real-time attack detection, data leakage vulnerability assessments and many more. [...]
2020 - 10.3390/electronics9010097
Electronics, Vol. 9 (2020) , p. 1-42  
6.
17 p, 524.8 KB A distributed token passing protocol for time constrained data gathering in VANETs / Chiti, Francesco (Università degli Studi di Firenze. Dipartimento di Ingegneria dell'Informazione) ; Fantacci, Romano (Università degli Studi di Firenze. Dipartimento di Ingegneria dell'Informazione) ; Nizzi, Francesca (Università degli Studi di Firenze. Dipartimento di Ingegneria dell'Informazione) ; Pierucci, Laura (Università degli Studi di Firenze. Dipartimento di Ingegneria dell'Informazione) ; Borrego Iglesias, Carlos (Universitat Autònoma de Barcelona. Departament d'Enginyeria de la Informació i de les Comunicacions)
This paper proposes a novel approach for time constrained information gathering in a typical Vehicular Ad Hoc Network (VANET), based on a token passing scheme, adapted to wireless communications by creating a virtual ring where nodes are connected to a predecessor and a successor node. [...]
2019 - 10.3390/electronics8080823
Electronics, Vol. 8, Issue 8 (August 2019) , art. 823  
7.
15 p, 1.3 MB High-Temperature Electrical and Thermal Aging Performance and Application Considerations for SiC Power DMOSFETs / Hamilton, Dean P. (University of Warwick) ; Jennings, M.R. (University of Warwick) ; Pérez Tomàs, Amador (Institut Català de Nanociència i Nanotecnologia) ; Russell, Stephen A.O. (University of Warwick) ; Hindmarsh, Steven A. (University of Warwick) ; Fisher, C.A. (University of Warwick) ; Mawby, Philip A. (University of Warwick)
The temperature dependence and stability of three different commercially-available unpackaged SiC Dmosfets have been measured. On-state resistances increased to 6 or 7 times their room temperature values at 350 °C. [...]
2017 - 10.1109/TPEL.2016.2636743
IEEE transactions on power electronics, Vol. 32, Issue 10 (October 2017) , p. 7967-7979  
8.
2 p, 1.6 MB Front-to-back ratio improvement of printed antennas based on electrically small resonators for microwave presence detectors / Aguilà Moliner, Pau (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Zuffanelli, Simone (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Zamora González, Gerard (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Paredes, Ferran (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Martín, Ferran, (Martín Antolín) (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Bonache Albacete, Jordi (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica)
The improvement of the front-to-back ratio (FBR) in low-profile antennas to be used in presence detection devices is explored. The main idea is to use electrically small resonators as radiating elements. [...]
2015 - 10.1049/el.2014.4303
Electronics letters, Vol. 51, Issue 11 (2015) , p. 836-837  
9.
17 p, 1.4 MB New high resolution random telegraph noise (RTN) characterization method for resistive RAM / Maestro, M. (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Díaz Fortuny, Javier (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Crespo Yepes, Albert (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; González, M.B. (Institut de Microelectrònica de Barcelona (CSIC)) ; Martín Martínez, Javier (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Rodríguez Martínez, Rosana (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Nafría i Maqueda, Montserrat (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Campabadal Segura, Francesca (Institut de Microelectrònica de Barcelona (CSIC)) ; Aymerich Humet, Xavier (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica)
Random Telegraph Noise (RTN) is one of the main reliability problems of resistive switching-based memories. To understand the physics behind RTN, a complete and accurate RTN characterization is required. [...]
2016 - 10.1016/j.sse.2015.08.010
Solid-state electronics, Vol. 115, Part B (January 2016) , p. 140-145  
10.
2 p, 248.0 KB Two-dimensional displacement and alignment sensor based on reflection coefficients of open microstrip lines loaded with split ring resonators / Karami-Horestani, Ali (University of Adelaide (Adelaide, Austràlia). School of Electrical & Electronic Engineering) ; Naqui Garolera, Jordi (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Abbott, Derek (University of Adelaide (Adelaide, Austràlia). School of Electrical & Electronic Engineering) ; Fumeaux, Cristophe (University of Adelaide (Adelaide, Austràlia). School of Electrical & Electronic Engineering) ; Martín, Ferran, (Martín Antolín) (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica)
A two-dimensional displacement and alignment sensor is proposed based on two open-ended transmission lines, each loaded with a split ring resonator (SRR). In this arrangement, the depth of resonance-induced notches in the reflection coefficients can be used to sense a displacement of the loading SRRs in two orthogonal directions. [...]
2014 - 10.1049/el.2014.0572
Electronics letters, Vol. 50, no. 8 (April 2014) , p. 620-622  

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