Parametric testing of metasurface stirrers for metasurfaced reverberation chambers - Resultats de la cerca

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Parametric testing of metasurface stirrers for metasurfaced reverberation chambers / Sun, Hengyi (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Gu, Changqing (Nanjing University of Aeronautics and Astronàutics. College of Electronic and Information Engineering) ; Li, Zhuo (Nanjing University of Aeronautics and Astronàutics. College of Electronic and Information Engineering) ; Xu, Qian (Nanjing University of Aeronautics and Astronàutics. College of Electronic and Information Engineering) ; Wei, Mengmeng (Northwest A&F University. College of Humanities & Social Development) ; Song, Jiajia (Nanjing University of Aeronautics and Astronàutics. College of Electronic and Information Engineering) ; Xu, Baijie (Nanjing University of Aeronautics and Astronàutics. College of Electronic and Information Engineering) ; Dong, Xiaohang (Nanjing University of Aeronautics and Astronàutics. College of Electronic and Information Engineering) ; Wang, Kuan (Nanjing University of Aeronautics and Astronàutics. College of Electronic and Information Engineering) ; Martín, Ferran, (Martín Antolín) (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica)
In this paper, the correlation coefficients and the total scattering cross sections (TSCSs) for different types of metasurfaced stirrers and the traditional metallic stirrer, and the effects on field uniformity when such stirrers are used in reverberation chambers, are analyzed. [...]
2019 - DOI (Digital Object Identifier)

10.3390/s19040976
Sensors (Basel, Switzerland), Vol. 19, issue 4 (Feb. 2019) , art. 976

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