Dipòsit Digital de Documents de la UAB 2 registres trobats  La cerca s'ha fet en 0.00 segons. 
1.
4 p, 392.4 KB Predictive model for scanned probe oxidation kinetics / Dagata, J. A. (National Institute of Standards and Technology (Gaithersburg, Estats Units d'Amèrica)) ; Pérez Murano, Francesc (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Abadal Berini, Gabriel (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Morimoto, K. (Matsushita Electrical Industrial (Osaka, Japó)) ; Inoue, T. (Electrotechnical Laboratory (Tsukuba, Japó)) ; Itoh, J. (Electrotechnical Laboratory (Tsukuba, Japó)) ; Yokoyama, H. (Electrotechnical Laboratory (Tsukuba, Japó)) ; American Physical Society
Previous descriptions of scanned probe oxidation kinetics involved implicit assumptions that one-dimensional, steady-state models apply for arbitrary values of applied voltage and pulse duration. These assumptions have led to inconsistent interpretations regarding the fundamental processes that contribute to control of oxide growth rate. [...]
2000 - 10.1063/1.126451
Applied Physics Letters, Vol. 76, Issue 19 (March 2000) , p. 2710-2712  
2.
4 p, 227.5 KB Measuring electrical current during scanning probe oxidation / Pérez Murano, Francesc (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Martín Olmos, Cristina (Institut de Microelectrònica de Barcelona (IMB-CNM)) ; Barniol i Beumala, Núria (Universitat Autònoma de Barcelona. Departament de Enginyeria Electrònica) ; Kuramochi, H. (Nanotechnology Research Institute (Ibaraki, Japó)) ; Yokoyama, H. (Nanotechnology Research Institute (Ibaraki, Japó)) ; Dagata, J. A. (National Institute of Standards and Technology (Gaithersburg, Estats Units d'Amèrica)) ; American Physical Society
Electrical current is measured during scanning probe oxidation by performing force versus distance curves under the application of a positive sample voltage. It is shown how the time dependence of the current provides information about the kinetics of oxide growth under conditions in which the tip–surface distance is known unequivocally during current acquisition. [...]
2003 - 10.1063/1.1572480
Applied Physics Letters, Vol. 82, Issue 18 (April 2003) , p. 3086-3088  

Us interessa rebre alertes sobre nous resultats d'aquesta cerca?
Definiu una alerta personal via correu electrònic o subscribiu-vos al canal RSS.