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1.
11 p, 5.7 MB Investigation on the conductive filament growth dynamics in resistive switching memory via a Universal Monte Carlo Simulator / Li, Yu (Chinese Academy of Sciences. Institute of Microelectronics (Beijing, Xina)) ; Zhang, Meiyun (Jiangsu National Synergetic Innovation Center for Advanced Materials) ; Long, Shibing (Chinese Academy of Sciences. Institute of Microelectronics (Beijing, Xina)) ; Teng, Jiao (University of Science and Technology (Beijing, Xina)) ; Liu, Qi (Jiangsu National Synergetic Innovation Center for Advanced Materials) ; Lv, Hangbing (Jiangsu National Synergetic Innovation Center for Advanced Materials) ; Miranda, Enrique (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Suñé, Jordi 1963- (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Liu, Ming (Jiangsu National Synergetic Innovation Center for Advanced Materials)
In resistive random access memories, modeling conductive filament growing dynamics is important to understand the switching mechanism and variability. In this paper, a universal Monte Carlo simulator is developed based on a cell switching model and a tunneling-based transport model. [...]
2017 - 10.1038/s41598-017-11165-5
Scientific reports, Vol. 7 (Sep. 2017) , art. 11204  
Detailed record - Creative Commons
2.
7 p, 1.5 MB An improved analytical model for the statistics of SET emergence point in HfO2 memristive device / Xiang, Dong (Harbin Institute of Technology. School of Mechatronics Engineering (China)) ; Zhang, Rulin (Hubei University. Hubei Key Laboratory of Applied Mathematics (China)) ; Li, Yu (Institute of Microelectronics of Chinese Academy of Sciences. Key Laboratory of Microelectronics Devices and Integration Technology (China)) ; Ye, Cong (Hubei University. Hubei Key Laboratory of Applied Mathematics (China)) ; Miranda, Enrique (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Suñé, Jordi, 1963- (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Long, Shibing (University of Science and Technology of China. School of Microelectronics (China))
In this work, an improved analytical model for the SET switching statistics of HfO2 memristive device is developed from the cell-based percolation model. The statistical results of the SET emergence point related to the beginning stage during SET process are systematically discussed. [...]
2019 - 10.1063/1.5085685
AIP advances, Vol. 9, Issue 2 (February 2019) , art. 025118  
Detailed record - Creative Commons
3.
6 p, 1.1 MB Analysis on the filament structure evolution in reset transition of Cu/HfO₂/Pt RRAM device / Zhang, Meiyun (Chinese Academy of Sciences. Institute of Microelectronics (Beijing)) ; Long, Shibing (Chinese Academy of Sciences. Institute of Microelectronics (Beijing)) ; Li, Yang (Chinese Academy of Sciences. Institute of Microelectronics (Beijing)) ; Liu, Qi (Chinese Academy of Sciences. Institute of Microelectronics (Beijing)) ; Lv, Hangbing (Chinese Academy of Sciences. Institute of Microelectronics (Beijing)) ; Miranda, Enrique (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Suñé, Jordi, 1963- (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Liu, Ming (Chinese Academy of Sciences. Institute of Microelectronics (Beijing))
The resistive switching (RS) process of resistive random access memory (RRAM) is dynamically correlated with the evolution process of conductive path or conductive filament (CF) during its breakdown (rupture) and recovery (reformation). [...]
2016 - 10.1186/s11671-016-1484-8
Nanoscale Research Letters, Vol. 11 (May 2016) , art. 269  
Detailed record - Creative Commons
4.
30 p, 3.6 MB Conductance quantization in resistive random access memory / Li, Yang (Chinese Academy of Sciences. Institute of Microelectronics (Beijing)) ; Long, Shibing (Chinese Academy of Sciences. Institute of Microelectronics (Beijing)) ; Liu, Yang (University of Science and Technology Beijing. Department of Materials Physics and Chemistry) ; Hu, Chen (University of Science and Technology Beijing. Department of Materials Physics and Chemistry) ; Teng, Jiao (University of Science and Technology Beijing. Department of Materials Physics and Chemistry) ; Liu, Qi (Chinese Academy of Sciences. Institute of Microelectronics (Beijing)) ; Lv, Hangbing (Chinese Academy of Sciences. Institute of Microelectronics (Beijing)) ; Suñé, Jordi 1963- (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Liu, Ming (Chinese Academy of Sciences. Institute of Microelectronics (Beijing))
The intrinsic scaling-down ability, simple metal-insulator-metal (MIM) sandwich structure, excellent performances, and complementary metal-oxide-semiconductor (CMOS) technology-compatible fabrication processes make resistive random access memory (RRAM) one of the most promising candidates for the next-generation memory. [...]
2015 - 10.1186/s11671-015-1118-6
Nanoscale Research Letters, Vol. 10 (December 2015) , art. 420  
Detailed record - Creative Commons
5.
8 p, 1.2 MB Voltage and power-controlled regimes in the progressive unipolar RESET transition of HfO₂-based RRAM / Long, Shibing (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Perniola, Luca (Laboratoire d'électronique des technologies de l'information. MINATEC) ; Cagli, Carlo (Laboratoire d'électronique des technologies de l'information. MINATEC) ; Buckley, Julien (Laboratoire d'électronique des technologies de l'information. MINATEC) ; Lian, Xiaojuan (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Miranda, Enrique (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Pan, Feng (Tsinghua University. Laboratory of Advanced Materials) ; Liu, Ming (Chinese Academy of Sciences. Laboratory of Nanofabrication and Novel Device Integration (Beijing, Xina)) ; Suñé, Jordi, 1963- (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica)
Resistive switching (RS) based on the formation and rupture of conductive filament (CF) is promising in novel memory and logic device applications. Understanding the physics of RS and the nature of CF is of utmost importance to control the performance, variability and reliability of resistive switching memory (RRAM). [...]
2013 - 10.1038/srep02929
Scientific reports, Vol. 3, (October 2013) , art. 2929  
Detailed record - Creative Commons
6.
5 p, 1.1 MB Quantum size effects in hafnium-oxide resistive switching / Long, Shibing (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Suñé, Jordi, 1963- (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Lian, Xiaojuan (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Cagli, Carlo (Commissariat à l'Énergie Atomique et aux Énergies Alternatives (França)) ; Cartoixà Soler, Xavier (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Rurali, Riccardo (Institut de Ciència de Materials de Barcelona) ; Miranda, Enrique (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Jiménez Jiménez, David (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Perniola, Luca (Commissariat à l'Énergie Atomique et aux Énergies Alternatives (França)) ; Liu, Ming (Chinese Academy of Sciences. Laboratory of Nanofabrication and Novel Device Integration (Beijing, Xina)) ; American Physical Society
Discrete changes of conductance of the order of G0 = 2e2/h reported during the unipolar reset transitions of Pt/HfO2/Pt structures are interpreted as the signature of atomic-size variations of the conducting filament (CF) nanostructure. [...]
2013 - 10.1063/1.4802265
Applied physics letters, Vol. 102, Issue 18 (May 2013) , p. 183505/1-183505/4  
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See also: similar author names
1 Long, S.
3 Long, Sam
1 Long, Steve
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