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4 p, 361.0 KB Conical refraction as a tool for polarization metrology / Peinado Capdevila, Alba (Universitat Autònoma de Barcelona. Departament de Física) ; Turpin Avilés, Alejandro (Universitat Autònoma de Barcelona. Departament de Física) ; Lizana Tutusaus, Ángel (Universitat Autònoma de Barcelona. Departament de Física) ; Fernandez Moreno, Estefania (Universitat Autònoma de Barcelona. Departament de Física) ; Mompart Penina, Jordi (Universitat Autònoma de Barcelona. Departament de Física) ; Campos Coloma, Juan (Universitat Autònoma de Barcelona. Departament de Física)
A method for polarization metrology based on the conical refraction (CR) phenomenon, occurring in biaxial crystals, is reported. CR transforms an input Gaussian beam into a light ring whose intensity distribution is linked to the incoming polarization. [...]
2013 - 10.1364/OL.38.004100
Optics letters, Vol. 38, No. 20 (15 October 2013) , p. 4100-4103  
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