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4 p, 630.0 KB Modification of HF-treated silicon (100) surfaces by scanning tunneling microscopy in air under imaging conditions / Barniol i Beumala, Núria (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Pérez Murano, Francesc (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Aymerich Humet, Xavier (Universitat Autònoma de Barcelona. Departament de Física) ; American Physical Society
The modification of HF-etched silicon (100) surface with a scanning tunneling microscope(STM) operated in air is studied for the first time in samples subjected to the standard HF etching without the follow-up rinsing in H2O. [...]
1992 - 10.1063/1.107885
Applied physics letters, Vol. 61, Issue 4 (July 1992) , p. 462-464  
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