Self-addressed diffractive lens schemes for the characterization of LCoS displays
Zhang, Haolin (Universitat Autònoma de Barcelona. Departament de Física)
Lizana Tutusaus, Ángel (Universitat Autònoma de Barcelona. Departament de Física)
Iemmi, Claudio (Universidad de Buenos Aires. Departamento de Física)
Monroy Ramírez, Freddy A. (Universidad Nacional de Colombia. Departamento de Física)
Márquez Ruiz, Andrés (Universitat d'Alacant. Departament de Física, Enginyeria de Sistemes i Teoria de la Senyal)
Moreno, Ignacio (Universidad Miguel Hernández de Elche. Departamento de Ciencia de Materiales, Óptica y Tecnología Electrónica)
Campos Coloma, Juan (Universitat Autònoma de Barcelona. Departament de Física)

Fecha:	2018
Resumen:	We proposed a self-calibration method to calibrate both the phase-voltage look-up table and the screen phase distribution of Liquid Crystal on Silicon (LCoS) displays by implementing different lens configurations on the studied device within a same optical scheme. On the one hand, the phase-voltage relation is determined from interferometric measurements, which are obtained by addressing split-lens phase distributions on the LCoS display. On the other hand, the surface profile is retrieved by self-addressing a diffractive micro-lens array to the LCoS display, in a way that we configure a Shack-Hartmann wavefront sensor that self-determines the screen spatial variations. Moreover, both the phase-voltage response and the surface phase inhomogeneity of the LCoS are measured within the same experimental set-up, without the necessity of further adjustments. Experimental results prove the usefulness of the above-mentioned technique for LCoS displays characterization.
Nota:	Ponència presentada a: Emerging Liquid Crystal Technologies (San Francisco, California: 13th, 27 January - 1 February 2018)
Derechos:	Tots els drets reservats.
Lengua:	Anglès
Documento:	Article ; recerca ; Versió acceptada per publicar
Materia:	Liquid Crystals ; Calibration ; Holographic display ; Surface Measurement
Publicado en:	Proceedings of SPIE, Vol. 10555, (February 2018) , ISSN 1996-756X

DOI: 10.1117/12.2290434

Post-print 12 p, 6.1 MB

El registro aparece en las colecciones:
Artículos > Artículos de investigación
Artículos > Artículos publicados