Strategies for parameter extraction of the time constant distribution of time-dependent variability models for nanometer-scale devices
Fernandez, F. V. (Instituto de Microelectrónica de Sevilla)
Roca, E. (Instituto de Microelectrónica de Sevilla)
Saraza, P. (Interuniversitair Micro-Elektronica Centrum (Belgium))
Martin Martinez, Javier (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica)
Rodríguez Martínez, Rosana (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica)
Nafría i Maqueda, Montserrat (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica)
Castro-Lopez, R. (Instituto de Microelectrónica de Sevilla)

Date:	2023
Abstract:	Time-dependent variability phenomena are stochastic and discrete for nanometer-scale technologies, and, hence, must be statistically characterized. These phenomena are attributed to the emission and capture of charges in device defects. This paper explores two different strategies to extract, from experimental data, the distribution parameters of the time constants of the defects. It delves into the accuracy of each strategy, showing how the extraction strategy can have a huge impact on the accuracy and the amount of characterization data required, and, therefore, on the amount of (expensive) characterization time in the lab.
Grants:	Agencia Estatal de Investigación PID2019-103869RB-C31 Agencia Estatal de Investigación PID2019-103869RB-C32 Agencia Estatal de Investigación TED2021-131240B-I00
Note:	Altres ajuts: ProyExcel_00536 funded by Consejería de Universidad, Investigación e Innovación of Junta de Andalucía
Rights:	Tots els drets reservats.
Language:	Anglès
Document:	Capítol de llibre ; recerca ; Versió acceptada per publicar
Subject:	Characterization ; Modeling ; Parameter extraction ; Time-dependent variability
Published in:	19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2023, ISBN 979-8-3503-3265-0

DOI: 10.1109/SMACD58065.2023.10192206

Available from: 2025-07-31 Postprint

The record appears in these collections:
Research literature > UAB research groups literature > Research Centres and Groups (research output) > Engineering > The Reliability of Electron Devices and Circuits group (REDEC)
Books and collections > Book chapters