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51 p, 6.4 MB Machine learning in electron microscopy for advanced nanocharacterization : current developments, available tools and future outlook / Botifoll, Marc (Institut Català de Nanociència i Nanotecnologia) ; Pinto-Huguet, Ivan (Institut Català de Nanociència i Nanotecnologia) ; Arbiol i Cobos, Jordi (Institut Català de Nanociència i Nanotecnologia)
In the last few years, electron microscopy has experienced a new methodological paradigm aimed to fix the bottlenecks and overcome the challenges of its analytical workflow. Machine learning and artificial intelligence are answering this call providing powerful resources towards automation, exploration, and development. [...]
2022 - 10.1039/d2nh00377e
Nanoscale horizons, Vol. 7, issue 12 (Dec. 2022) , p. 1427-1477  
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