Index of artpub/2010/138451/

Crespo-Yepes, Albert
Recovery of the MOSFET and circuit functionality after the dielectric breakdown of ultra-thin high-k gate stacks
2010
https://ddd.uab.cat/record/138451
[ICO]NameLast modifiedSizeDescription
[PARENTDIR]Parent Directory  -  
[ ]1=Crespo-Yepes,_Albert2022-06-29 13:26 21  
[ ]2=Recovery_of_the_MOSFET_and_circuit_functionality...2022-06-29 13:26 113  
[ ]3=20102022-06-29 13:26 5  
[ ]4=1384512022-06-29 13:26 34  
[TXT]138451.dirinfo2022-06-30 03:51 318  
[ ]138451.du2022-06-30 03:51 49  
[TXT]138451.dupdirs2022-06-30 03:51 0  
[TXT]138451.dupfiles2022-06-30 03:51 0  
[TXT]138451.errors2022-06-30 03:51 0  
[TXT]138451.md52022-06-30 03:51 65  
[TXT]138451.sha12022-06-30 03:51 73  
[TXT]138451.sha2562022-06-30 03:51 97  
[TXT]138451.stats2022-06-30 03:51 268  
[IMG]eledevlet_a2010m6v31n6p543.gif2015-10-28 17:00 12K 
[IMG]eledevlet_a2010m6v31n6p543.ico2015-10-28 17:00 41K 
[TXT]eledevlet_a2010m6v31n6p543.info2015-10-28 17:00 2.0K 
[ ]eledevlet_a2010m6v31n6p543.pdf2015-10-28 17:00 1.0M 
[TXT]eledevlet_a2010m6v31n6p543.txt2015-10-28 17:00 29K