Index of artpub/2010/138451/

Crespo-Yepes, Albert
Recovery of the MOSFET and circuit functionality after the dielectric breakdown of ultra-thin high-k gate stacks
2010
https://ddd.uab.cat/record/138451
[ICO]NameLast modifiedSizeDescription
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[ ]1=Crespo-Yepes,_Albert2022-06-29 13:26 21  
[ ]2=Recovery_of_the_MOSFET_and_circuit_functionality...2022-06-29 13:26 113  
[ ]3=20102022-06-29 13:26 5  
[ ]4=1384512022-06-29 13:26 34  
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[TXT]138451.stats2024-10-02 05:10 268  
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[TXT]eledevlet_a2010m6v31n6p543.txt2015-10-28 17:00 29K