Index of artpub/2011/138450/

Crespo-Yepes, Albert
Injected charge to recovery as a parameter to characterize the breakdown reversibility of ultrathin HfSiON gate dielectric
2011
https://ddd.uab.cat/record/138450
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[ ]1=Crespo-Yepes,_Albert2022-06-29 13:26 21  
[ ]2=Injected_charge_to_recovery_as_a_parameter...2022-06-29 13:26 123  
[ ]3=20112022-06-29 13:26 5  
[ ]4=1384502022-06-29 13:26 34  
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