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Procedures and practices for evaluating thin-film solar cell stability
Roesch, Roland (Friedrich Schiller University Jena)
Faber, Tobias (Friedrich Schiller University Jena)
Von Hauff, Elizabeth (Vrije Universiteit Amsterdam. Department of Physics and Astronomy)
Brown, Thomas M. (University of Rome Tor Vergata. Department of Electronic Engineering)
Lira Cantú, Mónica (Institut Català de Nanociència i Nanotecnologia)
Hoppe, Harald (Friedrich Schiller University Jena)

Fecha: 2015
Resumen: During the last few decades, and in some cases only the last few years, novel thin-film photovoltaic (PV) technologies such as dye-sensitized solar cells (DSSC), organic solar cells (OPV), and, more recently, perovskite-based solar cells (PSC) have been growing in maturity with respect to device performance and device stability. Together with new material systems, novel device architectures have also been introduced. Both parameters will have an effect on the overall device stability. In order to improve the understanding of degradation effects and how they can be prevented, stress testing under different conditions is commonly applied. By careful combination of stress factors and thorough analysis of photovoltaic parameter decaying curves, an understanding of the underlying degradation pathways can be gained. With the help of standardized and accelerated stress tests, as described in the ISOS-protocols, statements concerning application lifetimes can finally be made and compared among different labs. Once a photovoltaic technology has proven long lasting durability, the ultimate barrier for entering the commercial market are the IEC tests, taking a deeper look on overall safety and reliability, not only on durability. Here, the most prominent stress tests are reviewed, discussed and extended with respect to learning the most about photovoltaic device stability. Common procedures and practices for evaluating thin-film solar cell stability and durability are reviewed with respect to their applicability for predicting failure routes and application lifetimes. Suggestions for the reporting of detailed stress factors, photovoltaic parameters with sufficient statistical weight, and new figures of merit are made with the goal of steepening the learning curve towards real applications.
Nota: Número d'acord de subvenció MINECO/ENE2013‐48816‐C5‐4‐R
Nota: Número d'acord de subvenció AGAUR/2014/SGR-1212
Derechos: Tots els drets reservats.
Lengua: Anglès.
Documento: article ; recerca ; submittedVersion
Materia: Thin‐film solar cells ; Stability testing protocols ; Burn‐in ; Long‐term degradation ; Operational stability
Publicado en: Advanced Energy Materials, Vol. 5, Issue 20 (October 2015) , art. 1501407, ISSN 1614-6840

DOI: 10.1002/aenm.201501407

61 p, 1.7 MB

El registro aparece en las colecciones:
Documentos de investigación > Documentos de los grupos de investigación de la UAB > Centros y grupos de investigación (producción científica) > Ciencias > Institut Català de Nanociència i Nanotecnologia (ICN2)
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 Registro creado el 2019-12-20, última modificación el 2020-02-06

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