Quantitative phase analysis of bentonites by the rietveld method
Ufer, Kristian (TU Bergakademie Freiberg. Institute of Mineralogy)
Stanjek, H. (RWTH Aachen University. Clay and Interface Mineralogy)
Roth, G. (RWTH Aachen University. Institute of Crystallography)
Dohrmann, Reiner (BGR/LBEG)
Kleeberg, R.
Kaufhold, Stephan (BGR/LBEG)

Fecha:	2008
Resumen:	Thirty six bentonite samples from 16 different locations were examined in order to demonstrate the applicability of a new Rietveld description approach for quantitative phase analysis. X-ray diffraction patterns of the bulk material were obtained and analyzed by the Rietveld method. The samples contain up to ten different minerals, with dioctahedral smectite as the major component. A model for turbostratic disorder of smectites was formulated inside a structure-description file of the Rietveld program BGMN. The quality of the refinements was checked using an internal standard mineral (10. 0 or 20. 0 wt. % corundum) and by cross-checking results with X-ray fluorescence (XRF) data. The corundum content was reproduced with only small deviations from the nominal values. A comparison of the chemical composition obtained by XRF and the composition as re-calculated from quantitative Rietveld results shows a satisfactory agreement, although X-ray amorphous components such as volcanic glasses were not considered. As a result of this study, the Rietveld method combined with the new structure model for turbostratic disorder has proven to be a suitable method for routine quantitative analysis of bentonites with smectites as the dominant clay minerals.
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Lengua:	Anglès
Documento:	Article ; recerca ; Versió publicada
Materia:	Bentonite ; Quantification ; Rietveld analysis ; Smectite
Publicado en:	Clays and Clay Minerals, Vol. 56, Núm. 2 (2008) , p. 272-282, ISSN 1552-8367

DOI: 10.1346/CCMN.2008.0560210

11 p, 467.8 KB  Acceso restringido a la UAB

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