The Athena x-ray optics development and accommodation
Bavdaz, Marcos (European Space Agency (Països Baixos))
Wille, Eric (European Space Agency (Països Baixos))
Ayre, Mark (European Space Agency (Països Baixos))
Ferreira, Ivo (European Space Agency (Països Baixos))
Shortt, Brian (European Space Agency (Països Baixos))
Fransen, Sebastiaan (European Space Agency (Països Baixos))
Millinger, Mark (European Space Agency (Països Baixos))
Collon, Maximilien J. (Cosine measurement systems (Països Baixos))
Vacanti, Giuseppe (Cosine measurement systems (Països Baixos))
Barrière, M. (Cosine measurement systems (Països Baixos))
Landgraf, Boris (Cosine measurement systems (Països Baixos))
Riekerink, Mark O. (Micronit B.V. (Països Baixos))
Haneveld, Jeroen (Micronit B.V. (Països Baixos))
Start, Roland (Micronit B.V. (Països Baixos))
Baren, Coen van (SRON Netherlands Institute for Space Research (Països Baixos))
Ferreira, Desiree Della Monica (DTU Space (Dinamarca))
Massahi, Sonny (DTU Space (Dinamarca))
Svendsen, Sara (DTU Space (Dinamarca))
Christensen, Finn (DTU Space (Dinamarca))
Krumrey, Michael (Physikalisch-Technische Bundesanstalt (Alemanya))
Handick, Evelyn (Physikalisch-Technische Bundesanstalt (Alemanya))
Burwitz, Vadim (Max-Planck-Institut für extraterrestrische Physik (Alemanya))
Bradshaw, Miranda J. (Max-Planck-Institut für extraterrestrische Physik)
Pareschi, Giovanni (INAF - Osservatorio Astronomico di Brera)
Valsecchi, Giuseppe (Media Lario S.r.l.)
Vernani, Dervis (Media Lario S.r.l.)
Kailla, Geeta (Teledyne e2v UK Ltd.)
Mundon, William (Teledyne e2v UK Ltd.)
Phillips, Gavin (Teledyne e2v UK Ltd.)
Schneider, Jakob (Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS (Alemanya))
Korhonen, Tapio (Opteon Oy (Finlàndia))
Sánchez Grueso, Alejandro (ALBA Laboratori de Llum de Sincrotró)
Heinis, Dominique (ALBA Laboratori de Llum de Sincrotró)
Tordi, Massimiliano (EIE S.r.l. (Itàlia))
Willingale, Richard (University of Leicester (Regne Unit))

Date:	2021
Abstract:	The Athena mission, under study and preparation by ESA as its second Large-class science mission, requires the largest X-ray optics ever flown, building on a novel optics technology based on mono crystalline silicon. Referred to as Silicon Pore Optics technology (SPO), the optics is highly modular and benefits from technology spin-in from the semiconductor industry. The telescope aperture of about 2. 5 meters is populated by around 700 mirror modules, accurately co-aligned to produce a common focus. The development of the SPO technology is a joint effort by European industrial and research entities, working together to address the challenges to demonstrate the imaging performance, robustness and efficient series production of the Athena optics. A technology development plan was established and is being regularly updated to reflect the latest developments, and is fully funded by the ESA technology development programmes. An industrial consortium was formed to ensure coherence of the individual technology development activities. The SPO technology uses precision machined mirror plates produced using the latest generation top quality 12 inch silicon wafers, which are assembled into rugged stacks. The surfaces of the mirror plates and the integral support structure is such, that no glue is required to join the individual mirror plates. Once accurately aligned with respect to each other, the surfaces of the mirror plates merge in a physical bonding process. The resultant SPO mirror modules are therefore very accurate and stable and can sustain the harsh conditions encountered during launch and are able to tolerate the space environment expected during operations. The accommodation of the Athena telescope is also innovative, relying on a hexapod mechanism to align the optics to the selected detector instruments located in the focal plane. System studies are complemented by dedicated technology development activities to demonstrate the capabilities before the adoption of the Athena mission.
Rights:	Tots els drets reservats.
Language:	Anglès
Document:	Article ; recerca ; Versió publicada
Subject:	X-ray optics ; X-ray astronomy ; ATHENA ; Silicon Pore Optics ; X-ray telescopes ; X-ray testing ; Technology preparation
Published in:	Proceedings of SPIE, Vol. 11852 (2021) , art. 1185220, ISSN 1996-756X

DOI: 10.1117/12.2599341

17 p, 3.3 MB

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