Thermoreflectance techniques and Raman thermometry for thermal property characterization of nanostructures
Sandell, Susanne (Norwegian University of Science and Technology. Department of Structural Engineering)
Chávez Ángel, Emigdio (Institut Català de Nanociència i Nanotecnologia)
Sachat, Alexandros el (Institut Català de Nanociència i Nanotecnologia)
He, Jianying (Norwegian University of Science and Technology. Department of Structural Engineering)
Sotomayor Torres, Clivia M. (Institut Català de Nanociència i Nanotecnologia)
Maire, Jeremie (Institut Català de Nanociència i Nanotecnologia)

Fecha:	2020
Resumen:	The widespread use of nanostructures and nanomaterials has opened up a whole new realm of challenges in thermal management, but also leads to possibilities for energy conversion, storage, and generation, in addition to numerous other technological applications. At the microscale and below, standard thermal measurement techniques reach their limits, and several novel methods have been developed to overcome these limitations. Among the most recent, contactless photothermal methods have been widely used and have proved their advantages in terms of versatility, temporal and spatial resolution, and even sensitivity in some situations. Among them, thermoreflectance and Raman thermometry have been used to measure the thermal properties from bulk materials to thin films, multilayers, suspended structures, and nanomaterials. This Tutorial presents the principles of these two techniques and some of their most common implementations. It expands to more advanced systems for spatial mapping and for probing of non-Fourier thermal transport. Finally, this paper concludes with discussing the limitations and perspectives of these techniques and future directions in nanoscale thermometry.
Ayudas:	European Commission 713450 European Commission 289061 Agencia Estatal de Investigación SEV-2017-0706 Ministerio de Ciencia e Innovación PGC2018-101743-B-I00
Nota:	This AIP article is published under license by AIP: https://publishing.aip.org/wp-content/uploads/2019/10/AIPP-Author-License.pdfPublishing.https://pubs.acs.org/page/policy/authorchoice_termsofuse.html
Nota:	Altres ajuts: ICN2 is supported by the CERCA Programme/Generalitat de Catalunya.
Derechos:	Tots els drets reservats.
Lengua:	Anglès
Documento:	Article ; recerca ; Versió publicada
Materia:	Nanoscale thermometries ; Photothermal methods ; Property characterizations ; Suspended structure ; Technological applications ; Temporal and spatial ; Thermal measurement technique ; Thermoreflectance
Publicado en:	Journal of applied physics, Vol. 128, issue 13 (Oct. 2020) , art. 131101, ISSN 1089-7550

DOI: 10.1063/5.0020239

26 p, 4.2 MB

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Documentos de investigación > Documentos de los grupos de investigación de la UAB > Centros y grupos de investigación (producción científica) > Ciencias > Institut Català de Nanociència i Nanotecnologia (ICN2)
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