Aguirre, Fernando Leonel; Pazos, Sebastián M.; Palumbo, Félix; [et al.]. «Assessment and improvement of the pattern recognition performance of memdiode-based cross-point arrays with randomly distributed stuck-at-faults». Electronics, Vol. 10, Issue 19 (October 2021), art. 2427. DOI 10.3390/electronics10192427 <https://ddd.uab.cat/record/251897> [Consulta: 8 abril 2025].