Non-Destructive Tomographic Nanoscale Imaging of Ferroelectric Domain Walls
He, Jiali (Norwegian University of Science and Technology. Department of Materials Science and Engineering)
Zahn, Manue l (Universität Augsburg)
Ushakov, Ivan N. (Norwegian University of Science and Technology. Department of Materials Science and Engineering)
Richarz, Leonie (Norwegian University of Science and Technology. Department of Materials Science and Engineering)
Ludacka, Ursula (Norwegian University of Science and Technology. Department of Materials Science and Engineering)
Roede, Erik D. (Norwegian University of Science and Technology. Department of Materials Science and Engineering)
Yan, Zewu (Lawrence Berkeley National Laboratory)
Bourret, Edith (Lawrence Berkeley National Laboratory)
Kézsmárki, István (Universität Augsburg)
Catalan, Gustau (Institut Català de Nanociència i Nanotecnologia)
Meier, Dennis (Norwegian University of Science and Technology. Department of Materials Science and Engineering)

Date:	2024
Abstract:	Extraordinary physical properties arise at polar interfaces in oxide materials, including the emergence of 2D electron gases, sheet-superconductivity, and multiferroicity. A special type of polar interface is ferroelectric domain walls, where electronic reconstruction phenomena can be driven by bound charges. Great progress has been achieved in the characterization of such domain walls and, over the last decade, their potential for next-generation nanotechnology has become clear. Established tomography techniques, however, are either destructive or offer insufficient spatial resolution, creating a pressing demand for 3D imaging compatible with future fabrication processes. Here, non-destructive tomographic imaging of ferroelectric domain walls is demonstrated using secondary electrons. Utilizing conventional scanning electron microscopy (SEM), the position, orientation, and charge state of hidden domain walls are reconstructed at distances up to several hundreds of nanometers away from the surface. A mathematical model is derived that links the SEM intensity variations at the surface to the local domain wall properties, enabling non-destructive tomography with good noise tolerance on the timescale of seconds. The SEM-based approach facilitates high-throughput screening of materials with functional domain walls and domain-wall-based devices, which is essential for monitoring during the production of device architectures and quality control in real-time.
Grants:	European Commission 863691
Rights:	Aquest document està subjecte a una llicència d'ús Creative Commons. Es permet la reproducció total o parcial, la distribució, la comunicació pública de l'obra i la creació d'obres derivades, fins i tot amb finalitats comercials, sempre i quan es reconegui l'autoria de l'obra original.
Language:	Anglès
Document:	Article ; recerca ; Versió publicada
Published in:	Advanced functional materials, Vol. 34, Issue 23 (June 2024) , art. 2314011, ISSN 1616-3028

DOI: 10.1002/adfm.202314011

7 p, 1.6 MB

The record appears in these collections:
Research literature > UAB research groups literature > Research Centres and Groups (research output) > Experimental sciences > Catalan Institute of Nanoscience and Nanotechnology (ICN2)
Articles > Research articles
Articles > Published articles