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285 p, 14.1 MB Advanced analysis of microelectronic devices and systems by lock-in IR thermography / León Cerro, Javier ; Perpiñà Giribet, Xavier, dir. ; Vellvehi, Miquel, dir. ; Abadal Berini, Gabriel, dir. (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ; Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica
Desde los inicios de la revolución microelectrónica, su evolución tecnológica siempre se ha visto marcada por la búsqueda constante de dispositivos y sistemas electrónicos monolíticos más compactos, fiables y robustos, ofreciendo mejores prestaciones y funcionalidades a un coste razonable. [...]
Since the microelectronic revolution, its technological evolution has been aimed at searching for more compact, reliable, and rugged electronic devices or integrated systems, offering as much performances and functionalities as possible at a lower cost. [...]
[Barcelona] : Universitat Autònoma de Barcelona, 2016  
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