Breaking preconceptions : Thin section petrography for ceramic glaze microstructures
Di Febo, Roberta (Universitat Autònoma de Barcelona. Departament de Ciències de l'Antiguitat i de l'Edat Mitjana)
Casas Duocastella, Lluís (Universitat Autònoma de Barcelona. Departament de Geologia)
Rius Palleiro, Jordi (Institut de Ciència de Materials de Barcelona)
Tagliapietra, Riccardo (Renishaw S.p.A)
Melgarejo Draper, Joan Carles (Universitat de Barcelona. Departament de Mineralogia, Petrologia i Geologia Aplicada)

Data:	2019
Resum:	During the last thirty years, microstructural and technological studies on ceramic glazes have been essentially carried out through the use of Scanning Electron Microscopy (SEM) combined with energy dispersive X-ray analysis (EDX). On the contrary, optical microscopy (OM) has been considered of limited use in solving the very complex and fine-scale microstructures associated with ceramic glazes. As the crystallites formed inside glazes are sub- and micrometric, a common misconception is that it is not possible to study them by OM. This is probably one of the reasons why there are no available articles and textbooks and even no visual resources for describing and characterizing the micro-crystallites formed in glaze matrices. A thin section petrography (TSP) for ceramic glaze microstructures does not exist yet, neither as a field of study nor conceptually. In the present contribution, we intend to show new developments in the field of ceramic glaze petrography, highlighting the potential of OM in the microstructural studies of ceramic glazes using petrographic thin sections. The outcomes not only stress the pivotal role of thin section petrography for the study of glaze microstructures but also show that this step should not be bypassed to achieve reliable readings of the glaze microstructures and sound interpretations of the technological procedures. We suggest the adoption by the scientific community of an alternative vision on glaze microstructures to turn thin section petrography for glaze microstructures into a new specialized petrographic discipline. Such an approach, if intensively developed, has the potential to reduce the time and costs of scientific investigations in this specific domain. In fact, it can provide key reference data for the identification of the crystallites in ceramic glazes, avoiding the repetition of exhaustive protocols of expensive integrated analyses.
Ajuts:	Agència de Gestió d'Ajuts Universitaris i de Recerca 2017/SGR-707 Ministerio de Economía y Competitividad MAT2015-67593-P Ministerio de Economía y Competitividad CGL2013-42167-P Ministerio de Economía y Competitividad SEV-2015-0496
Drets:	Aquest document està subjecte a una llicència d'ús Creative Commons. Es permet la reproducció total o parcial, la distribució, la comunicació pública de l'obra i la creació d'obres derivades, fins i tot amb finalitats comercials, sempre i quan es reconegui l'autoria de l'obra original.
Llengua:	Anglès
Document:	Article ; recerca ; Versió publicada
Matèria:	Thin section petrography ; Glaze microstructures ; SEM-EDS ; µXRD ; µRaman ; Tts-µXRD
Publicat a:	Minerals, Vol. 9, Issue 2 (February 2019) , art. 113, ISSN 2075-163X

DOI: 10.3390/min9020113

22 p, 13.7 MB

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