DC characterization and fast small-signal parameter extraction of organic thin film transistors with different geometries
Nafría i Maqueda, Montserrat (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica)
Crespo Yepes, Albert (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica)
Rodríguez Martínez, Rosana (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica)
Arnal Rus, August (Institut de Microelectrònica de Barcelona)
Ramon, Eloi (Institut de Microelectrònica de Barcelona)
Terés Terés, Lluís (Institut de Microelectrònica de Barcelona)

Date:	2020
Abstract:	Organic Devices offer low-cost manufacturing and better flexibility, sustainability and solution-processability than their Si-based MOS counterparts, which make them suitable for new applications where those characteristics are an advantage. However, organic device performance is still far from that provided by CMOS technology and many issues are still unclear. In this work, a performance comparison is made between Interdigitated and Corbino geometries of Organic Thin Film Transistors (OTFT), with different areas but fabricated with identical stack materials and techniques. To this end, I-V characteristics and C-V curves of the OTFTs were measured and a Common-Source circuit was proposed and implemented for extracting relevant electrical parameters of the devices, through a standard small signal analysis. The parameter extraction methodology in the frequency domain proposed allows rapid testing of the device/circuit performance of this technology, which for the first time is applied to organic devices. Results show that despite the large voltages, organic transistors exhibit similar channel dimension dependencies to MOS devices and can be also described by the same small signal model.
Grants:	Ministerio de Economía y Competitividad TEC2016-75151-C3-1-R Ministerio de Ciencia e Innovación RTI2018-102070-B-C21 Agència de Gestió d'Ajuts Universitaris i de Recerca 2017/SGR-1159
Rights:	Tots els drets reservats.
Language:	Anglès
Document:	Article ; recerca ; Versió acceptada per publicar
Subject:	Organic thin film transistors ; Capacitance ; Logic gates ; Performance evaluation ; Frequency response ; Capacitance measurement
Published in:	IEEE electron device letters, Vol. 41, Issue 10 (October 2020) , p. 1512-1515, ISSN 0741-3106

DOI: 10.1109/LED.2020.3021236

Postprint 5 p, 691.3 KB

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