2024-05-13
07:12 |
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Early English Language Learning : Exploring Pedagogical Practices in a Pre-Primary EFL Class in Catalonia through Systematic Observation
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Vraciu, Alexandra (Universitat de Lleida) ;
Pladevall Ballester, Elisabet (Universitat Autònoma de Barcelona. Departament de Filologia Anglesa i de Germanística)
In this study, we aim to analyse the extent to which classroom practices support the early stages of FL learning in pre-primary EFL instruction at a Catalan school. In particular, we explore different dimensions of the teaching-learning process regarding the characteristics of the tasks and activities used, the comprehensibility of the input, the support of learner output, the provision of corrective feedback, and the degree to which these dimensions are developed via the pedagogical practices used throughout a didactic sequence led by a specialist teacher of English.
Routledge, Taylor & Francis Group, 2024
Researching Educational Practices, Teacher Education and Professional Development for Early Language Learning Examples from Europe, chapter 5
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2024-05-10
16:37 |
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2024-05-07
05:56 |
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Beneficial role of noise in Hf-based memristors
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Rodríguez Martínez, Rosana (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ;
Martin Martinez, Javier (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ;
Salvador Aguilera, Emili (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ;
Crespo Yepes, Albert (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ;
Miranda, Enrique (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ;
Nafría i Maqueda, Montserrat (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ;
Rubio, Antonio 1954- (Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica) ;
Ntinas, Vasileios (Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica) ;
Sirakoulis, Georgios Ch (Democritus University of Thrace. Department of Electrical and Computer Engineering)
The beneficial role of noise in the performance of Hf-based memristors has been experimentally studied. The addition of an external gaussian noise to the bias circuitry positively impacts the memristors characteristics by increasing the OFF/ON resistances ratio. [...]
Institute of Electrical and Electronics Engineers Inc., 2022 -  10.1109/ISCAS48785.2022.9937850
2022 IEEE International Symposium on Circuits and Systems (ISCAS), 2022, p. 975-979
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2024-05-07
05:56 |
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Stochastic resonance effect in binary STDP performed by RRAM devices
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Salvador Aguilera, Emili (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ;
Rodríguez Martínez, Rosana (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ;
Martin Martinez, Javier (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ;
Crespo Yepes, Albert (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ;
Miranda, Enrique (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ;
Nafría i Maqueda, Montserrat (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ;
Rubio, Antonio 1954- (Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica) ;
Ntinas, Vasileios (Universitat Politècnica de Catalunya. Departament d'Enginyeria Electrònica) ;
Sirakoulis, Georgios Ch (Democritus University of Thrace. Department of Electrical and Computer Engineering)
The beneficial role of noise in the binary spike time dependent plasticity (STDP) learning rule, when implemented with memristors, is experimentally analyzed. The two memristor conductance states, which emulate the neuron synapse in neuromorphic architectures, can be better distinguished if a gaussian noise is added to the bias. [...]
2022 - 10.1109/NANO54668.2022.9928738
2022 IEEE 22nd International Conference on Nanotechnology (NANO), 2022, p. 449-452
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2024-05-03
05:45 |
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30 p, 1.4 MB |
A Fascist Coney Island? Salazar's dictatorship, popular culture and technological fun (1933-1943)
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Valentines-Álvarez, Jaume (Centro Interuniversitário de História das Ciências e da Tecnologia) ;
Sastre-Juan, Jaume (Universitat Autònoma de Barcelona. Institut d'Història de la Ciència)
This chapter deals with the place of amusement parks in Lisbon's geographies of leisure during the first decade of the Estado Novo (1933-1943). At a time in which the regime was developing its own model of fascist modernity, what form did the international, urban and mechanical fun of amusement parks take under Salazarism? By analyzing the different regimes of pleasure of the three major spaces of technological fun of the period (the Luna Parque at the Eduardo VII Park, 1933-35; the amusement park of the 1940 Exhibition of the Portuguese World in Belém; the Feira Popular created in 1943 in Palhavã) we explore the relations between global mass culture and the cultural program of the Estado Novo.
2022 - 10.1163/9789004513440_019
Science, Technology and Medicine in the Making of Lisbon (1840-1940), (2022) , p. 391-418
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2024-04-24
06:00 |
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A systematic approach to RTN parameter fitting based on the Maximum Current Fluctuation
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Saraza-Canflanca, P. (Instituto de Microelectrónica de Sevilla) ;
Martin Martinez, Javier (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ;
Roca, E. (Instituto de Microelectrónica de Sevilla) ;
Castro-Lopez, R. (Instituto de Microelectrónica de Sevilla) ;
Rodríguez Martínez, Rosana (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ;
Nafría i Maqueda, Montserrat (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ;
Fernandez, F. V. (Instituto de Microelectrónica de Sevilla)
This paper addresses the automated parameter extraction of Random Telegraph Noise (RTN) models in nanoscale field-effect transistors. Unlike conventional approaches based on complex extraction of current levels and timing of trapping/de-Trapping events from individual defects in current traces, the proposed approach performs a simple processing of current traces. [...]
2022 - 10.1109/SMACD55068.2022.9816234
18th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2022
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2024-04-24
06:00 |
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Strategies for parameter extraction of the time constant distribution of time-dependent variability models for nanometer-scale devices
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Fernandez, F. V. (Instituto de Microelectrónica de Sevilla) ;
Roca, E. (Instituto de Microelectrónica de Sevilla) ;
Saraza, P. (Interuniversitair Micro-Elektronica Centrum (Belgium)) ;
Martin Martinez, Javier (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ;
Rodríguez Martínez, Rosana (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ;
Nafría i Maqueda, Montserrat (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ;
Castro-Lopez, R. (Instituto de Microelectrónica de Sevilla)
Time-dependent variability phenomena are stochastic and discrete for nanometer-scale technologies, and, hence, must be statistically characterized. These phenomena are attributed to the emission and capture of charges in device defects. [...]
2023 - 10.1109/SMACD58065.2023.10192206
19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), 2023
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2024-04-19
05:44 |
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Overture : Urban Planning in a Mediterranean Port City: The Contested Nature of Urban Redevelopment in the El Raval Neighborhood in Barcelona
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Casellas, Antònia (Universitat Autònoma de Barcelona. Departament de Geografia) ;
Staff, Grant (Hofstra University. Department of Global Studies and Geography)
The chapter analyzes the urban restructuring of an emblematic downtown quarter of Barcelona, El Raval. Like other Mediterranean port cities which have retained historical downtown neighborhoods, El Raval, under the colloquial name of 'El Barrio Chino' (Chinatown), has symbolized Barcelona's attempts to preserve the character of the old city while simultaneously embarking on programs for urban renewal and a development strategy that relies on increasing numbers of tourists. [...]
Switzerland : Springer, 2023 (Cities, Heritage and Transformation (CHT)) - 10.1007/978-3-031-32326-3_2
Mediterranean Port Cities. Connectivity in Modern Times, (2023), p. 43-59
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2024-04-18
05:52 |
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6 p, 3.2 MB |
Noise prism : a novel multispectral visualization technique
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Canham, Trevor (York University) ;
Vázquez i Corral, Javier (Universitat Autònoma de Barcelona) ;
Long, David L. (Rochester Institute of Technology) ;
Murray, Richard F. (York University) ;
Brown, Michael S. (York University)
A novel technique for visualizing multispectral images is proposed. Inspired by how prisms work, our method spreads spectral information over a chromatic noise pattern. This is accomplished by populating the pattern with pixels representing each measurement band at a count proportional to its measured intensity. [...]
Springfield, VA : Society for Imaging Science and Technology, 2023 - 10.2352/CIC.2023.31.1.36
31st Color and Imaging Conference Final Program and Proceedings, (Nov. 2023) , p. 193 - 198
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2024-04-17
05:23 |
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Challenges and solutions to the defect-centric modeling and circuit simulation of time-dependent variability
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Martin Martinez, Javier (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ;
Diaz-Fortuny, Javier (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ;
Saraza-Canflanca, Pablo (Instituto de Microelectrónica de Sevilla) ;
Rodríguez Martínez, Rosana (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ;
Castro-Lopez, Rafael (Instituto de Microelectrónica de Sevilla) ;
Roca, Elisenda (Instituto de Microelectrónica de Sevilla) ;
Fernandez, Francisco V. (Instituto de Microelectrónica de Sevilla) ;
Nafría i Maqueda, Montserrat (Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica)
Time-Dependent Variability (TDV) phenomena represent a serious concern for device and circuit reliability. To address the TDV impact at circuit level, Reliability-Aware Design (RAD) tools can be used by circuit designers to achieve more reliable circuits. [...]
Institute of Electrical and Electronics Engineers Inc., 2023 - 10.1109/irps48203.2023.10118334
IEEE International Reliability Physics Symposium (IRPS) Proceedings, 2023
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