180 diffusion through amorphous SiOs and cristobalite
Rodríguez-Viejo, Javier (Institut des Sciences et de Génie des Matériaux et Procédés (Font-Romeu, França))
Sibieude, F. (Institut des Sciences et de Génie des Matériaux et Procédés (Font-Romeu, França))
Clavaguera-Mora, M. T. (Universitat Autònoma de Barcelona. Departament de Física)
Monty, C. (Laboratoire de Physique des Matériaux (Meudon, França))
American Physical Society

Fecha:	1993
Resumen:	Secondary ion mass spectrometry was used to profile the diffusion of oxygen in polycrystalline β-cristobalite and vitreous SiO2. The tracer concentration profiles of cristobalite are consistent with a model based on two mechanisms: bulk and short-circuit diffusion. The profiles of partially crystallized samples containing vitreous SiO2 and β-cristobalite were fitted using the sum of two complementary error functions and taking account of some interstitial-network exchange. The bulk oxygen diffusivity, in the temperature range 1240-1500 °C, is about five times greater for vitreous silica than for β-cristobalite.
Derechos:	Tots els drets reservats.
Lengua:	Anglès
Documento:	Article ; recerca ; Versió publicada
Materia:	Diffusion ; Mass diffusion ; Polycrystals ; Secondary ion mass spectroscopy ; Silica
Publicado en:	Applied physics letters, Vol. 63, Issue 14 (October 1993) , p. 1906-1908, ISSN 1077-3118

DOI: 10.1063/1.110644

4 p, 664.3 KB

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