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Monitoring defects in III-V materials :
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Monitoring defects in III-V materials : a nanoscale CAFM study
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Iglesias, V.
(Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica)
;
Wu, Q.
(Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ;
Porti i Pujal, Marc
(Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ;
Nafría i Maqueda, Montserrat
(Universitat Autònoma de Barcelona. Departament d'Enginyeria Electrònica) ;
Bersuker, G.
(Sematech) ;
Cordes, A.
(Sematech)
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